[0001] The present invention relates to a TV pick-up tube which is far higher in resolution
than conventional ones.
[0002] In order to get a picture image with high resolution by a television camera, the
number of scanning lines for producing a television signal has hitherto been increased.
The pick-up tube is usually made up of a photoconductive target for converting an
optical image into an electric signal, an electron gun for emitting a scanning electron
beam to detect the electric signal, and an electron beam control section for focusing
and deflecting the electron beam.
[0003] In order to improve the resolution of a pick-up tube by increasing the number of
scanning lines, various methods have been used, that is, the scanning electron beam
has been made thin, or a photo-conductive film having a high resolving power has been
used for forming the photoconductive target. A pick-up tube having such a construction
will be hereinafter referred to as "image pick-up tube for high definition television."
[0004] For example, a 1 in.(2,54 cm) image pick-up tube for high definition television using
1125 scanning lines and including a photo-conductive film which has a thickness of
4 to 6 µm and is made of an amorphous photo-conductive material containing selenium
as main component, can produce an amplitude response of about 45 % at 800 TV lines
(cf. the Journal of the Institute of Television Engineers of Japan, Vol. 39, No. 8,
August 1985, pages 663 to 674).
[0005] The conventional image pick-up tube for high definition television has high resolution
as mentioned above, but the resolution of the image pick-up tube is much less than
that of a 35 mm or 75 mm video film. Accordingly, it is ardently desired to further
improve the resolution of the image pick-up tube for high definition television.
[0006] When a scanning electron beam of large diameter is used in the above pick-up tube,
the improvement in resolution is limited by the beam diameter. Accordingly, it is
preferable to use a scanning electron beam having a small diameter. According to the
prior art, however, there arises a problem that even when the beam diameter of the
scanning electron beam is made small, the pick-up tube cannot have the desired high
resolution.
[0007] NHK Laboratories Note, No. 309, December 1984, pages 3-11, NHK, Tokyo, JP, T. Kawamura
et al., "A new high-resolution pick-up tube for live X-ray topography" relates to
a high definition pick-up tube for X-ray topography provided for replacing nuclear
plates. The pick-up tube comprises an amorphous Se-As alloy layer for X-ray sensing.
It is disclosed in this document to achieve a very high resolution by making the scanning
electron beam as narrow as 10 to 12 µm in diameter. Furthermore, it is mentioned in
this document that the capacitance of an ordinary 2/3 inch Saticon, i.e. of a thickness
of 4 µm, is 1600 pF, corresponding to a specific capacitance of 7.1 µF/m². This document,
however, is silent about the interdependence or the electron beam diameter and the
film thickness or capacity of the photoconductive layer.
[0008] The present invention is based on the finding that when a conventional image pick-up
tube for high definition television is operated, the variation in the surface potential
at the surface of the photoconductive film due to incident light is great, which makes
it impossible for the image pick-up tube to have the desired high resolution. In more
detail, when the scanning electron beam is made thin to attain high resolution, it
is deflected due to the above-mentioned great variation in the surface potential.
This effect is remarkable in the vicinity of the edge of an optical image, and thus
a reconstructed pattern will become fuzzy.
[0009] It is the object of the present invention to provide a TV pick-up tube, in which
the variation in the surface potential at the surface of the photoconductive film
is only small, and the resolution of the pick-up tube is markedly improved.
[0010] Furthermore, the pick-up tube shall be small-sized and include a photoconductive
film which is low in manufacturing costs, particularly concerning a reduction of the
deposition time of the photoconductive film, to enhance the manufacturing productivity.
[0011] This object is achieved according to claim 1. The dependent claims relate to preferred
embodiments.
[0012] According to the concept of the invention, the variation in the surface potential
at the surface of the photoconductive film is made small by increasing the capacity
of the photoconductive film.
[0013] The TV pick-up tube according to the present invention comprises
a photoconductive film for converting an optical image into electric signals, the
film being made of amorphous semiconductor material at least a portion of which contains
selenium as its main component, and having a capacity of 15 to 150 µF/m²,
a mesh electrode disposed so as to confront the photoconductive film, and
a diode type electron gun for emitting a scanning electron beam which is provided
with a beam limiting aperture limiting the diameter of the emitted electron beam and
having a diameter of 5 to 25 µm.
[0014] The capacity of the photoconductive film of 15 to 150 µF/m² leads to a marked reduction
of the surface potential variation.
[0015] For further improving the resolution, the thickness of the photoconductive film is
made small which further reduces the variation of the surface potential of the photoconductive
film.
[0016] In the following, the pick-up tube according to the present invention will be explained
in more details with reference to examples and the accompanying drawings. It is to
be noted that operation, shape, size and structural details of the pick-up tube can
be modified within the scope of the claims.
[0017] Fig. 1 shows a schematic cross-section of a pick-up tube, to which the present invention
is applied.
[0018] Fig. 2 is a diagram showing the relation between the capacity per unit area of the
photoconductive film and the amplitude response for a 2/3 in. (1,7 cm) pick-up tube
having a small beam limiting aperture and using 1125 scanning lines.
[0019] Fig. 3 is a diagram showing the relation between the distance between the mesh electrode
and the photoconductive film, and the amplitude response for a 2/3 in. (1.7 cm) pick-up
tube having a small beam limiting aperture and increased capacity of the photoconductive
film.
[0020] Figs.4a and 4b are schematic representations showing examples of the cross-sectional
structure of the beam limiting aperture according to the invention.
[0021] Prior to the explanation of the present invention, the structure and operation of
a pick-up tube will be explained.
[0022] Fig. 1 shows a schematic cross-section of a pick-up tube, to which the present invention
is applied. It comprises a cathode 1, a scanning electron beam 2, an electrode 3 for
controlling the electron beam 2, a beam limiting aperture 4, a photoconductive film
5, a mesh electrode 6, a transparent electrode 7, a face plate 8 made of glass, and
a glass bulb 9. When an external power source 10 is connected between the cathode
1 and the transparent electrode 7 as shown in Fig. 1, and further the photoconductive
film 5 is scanned with the focused electron beam 2, the surface of the photoconductive
film 5 on the scanning side is negatively charged, and the potential of this surface
becomes nearly equal to the cathode potential. That is, the photoconductive film 5
is charged up to a level substantially equal to the output level of the external power
source 10. When light is incident upon the photoconductive film 5,the resistance thereof
decreases, and thus the negative charges on the surface of the photoconductive film
5 are decreased by discharge. Accordingly, a charge pattern corresponding to the intensity
distribution of the incident light is formed on the surface of the photoconductive
film 5 on the scanning side, that is, a variation in the surface potential is caused
by the intensity distribution of the incident light. When the photoconductive film
5 is scanned with the electron beam 2, the electron beam 2 lands on the photoconductive
film 5 in accordance with the above variation in the surface potential, and hence
a charging current corresponding to the discharged electric quantity flows through
an amperemeter 11. Thus, the optical image formed on the photoconductive layer 5 is
time-sequentially converted into a signal current.
[0023] In connection with the invention the relation between the resolution of such a pick-up
tube and the capacity of the photoconductive film has been investigated in detail,
and it has been found that the resolution can be markedly improved by making the diameter
of the beam limiting aperture 4 small and by increasing the capacity of the photoconductive
film 5.
[0024] Fig. 2 shows an example of the relation between the capacity per unit area of the
photoconductive film and the amplitude response for a 2/3 in. (1.7 cm) photoconductive
pick-up tube provided with a beam limiting aperture having a diameter of 10 µm which
is operated with 1125 scanning lines. Fig. 2 shows that the amplitude response, that
is, the resolution of the pick-up tube, is greatly improved by making the capacity
per unit area (hereinafter referred to as "normalized capacity") of the photoconductive
film ≧ 15 µF/m². The resolution becomes higher the larger the normalized capacity
is made. However, when the normalized capacity is made too large, the lag, namely,
the delay of the photo-response, becomes remarkable. Accordingly, the normalized capacity
of the photoconductive film is made ≦ 150 µF/m²; the upper limit of the normalized
capacity should be determined in accordance with the specific purpose, for which the
pickup tube is used.
[0025] In a case where the photoconductive film is made of an amorphous photoconductive
material which contains selenium having a high resolving power as a main component,
by making the thickness of the photoconductive film ≦ 3.5 µm, the normalized capacity
of the film can be made greater than 15 µF/m² , and the resolution of the pick-up
tube can be markedly improved thereby.
[0026] The improvement in resolution by increasing the normalized capacity of the photoconductive
film is remarkable in a case where the diameter of the beam limiting aperture 4 is
made small, and a large number of scanning lines is used. When the diameter of the
beam limiting aperture is large, it is impossible to greatly improve the resolution
by increasing the normalized capacity of the photoconductive film, since the resolution
is restricted by the beam diameter determined by the beam limiting aperture 4.
[0027] Accordingly, it is desirable that the diameter of the beam limiting aperture 4 is
made smaller than 15 µm for a 2/3 in. (1.7 cm) pick-up tube, and smaller than 25 µm
for a 1 in.(2.54 cm) pick-up tube. However, the electric charge quantity carried by
the electron beam 2 decreases as the diameter of the beam limiting aperture 4 is smaller.
Accordingly, the lower limit of the diameter of the beam limiting aperture 4 is 5
µm.
[0028] Further, it is desirable to taper the beam limiting aperture 4 in the direction from
its exit toward its entrance, thereby enhancing the transmissivity for the electron
beam 2. Figs. 4a and 4b show examples of the beam limiting aperture 4. Preferably,
the cross-section profile of the (enlarged) portion of the beam limiting aperture
4 which is parallel to its center axis, is defined by a polygon-like plurality of
straight lines or a curved line on each side of the center axis, as shown in Figs.
4a or 4b, respectively.
[0029] Fig. 3 shows an example of the relation between the resolution of a 2/3 in.(1.7 cm)
photoconductive pick-up tube having the above-mentioned construction, and the distance
between the mesh electrode and the photoconductive film. As can be seen from Fig.
3, in order to improve the resolution of the pick-up tube to a great extent, the distance
between the mesh electrode 6 and the photoconductive film 5 must be in the range from
1 to 3 mm, and preferably in the range from 1 to 2 mm.
[0030] In the above description, a 2/3 in. (1.7 cm) pick-up tube has been explained, by
way of example. Of course, according to the invention, the resolution of other pick-up
tubes, such as 1 in. (2.54 cm) pick-up tubes, can also be improved analogously.
[0031] For example, a 1 in. (2.54 cm) pick-up tube and a 2/3 in. (1.7 cm) pick-up tube according
to the present invention were operated so as to have 1125 scanning lines, and produced
an amplitude response of more than 80 % and of about 40 %, respectively, at 800 TV
lines, while conventional pick-up tubes of the same size gave an amplitude response
of about 45 % and of about 30 %, respectively. As is evident from the above, the resolution
of pick-up tubes can be markedly improved on the basis of the present invention.
[0032] Now embodiments of pick-up tubes according to the present invention will be explained.
Embodiment I
[0033] A transparent electrode containing SnO₂ as its main component is deposited on a 1
in. (2.54 cm) diameter glass substrate by a chemical vapor deposition method, and
an amorphous photoconductive film made of selenium, arsenic and tellurium and containing
more than 50 % by mass of selenium is deposited on the transparent electrode by a
vacuum deposition method in a vacuum of less than 1.3 mPa (10⁻⁵ Torr). The thickness
of the photoconductive film is made such to be in the range of from 0.35 to 3.5 µm.
Next, a porous Sb₂S₃ film is deposited on the photo-conductive film in an atmosphere
of argon kept at a pressure of 1.3 Pa (10⁻² Torr) so that the thickness of the Sb₂S₃
film lies in the range of from 40 to 100 nm (400 to 1000 Å), to be used as an electron
beam landing layer. Thus, a photoconductive target having a normalized capacity of
more than 15 µF/m² is formed.
[0034] The above photoconductive target, an electron gun, a mesh electrode and an electrode
structure for focusing and deflecting the electron beam are mounted in a glass bulb,
which is then evacuated. In this pick-up tube, the diameter of the beam limiting aperture
is made equal to 15 µm.
Embodiment II
[0035] A transparent electrode containing SnO₂ or In₂O₃ as its main component is deposited
on a 2/3 in. (1.7 cm) diameter glass substrate by a chemical vapor deposition method
or by sputtering, and a CeO₂ film is deposited on the transparent electrode to a thickness
of 15 nm (150 Å) by a vacuum deposition method, to be used as a hole blocking layer.
Next, first, second and third photoconductive layers are successively deposited by
a vacuum deposition method so that a photoconductive film having a thickness of 0.35
to 3.5 µm is formed on the CeO₂ film. The first photoconductive layer is an amorphous
Se-As layer which has a thickness of 10 to 100 nm (100 to 1000 Å), and in which the
mean arsenic content is less than 15 % by mass. The second photoconductive layer serves
as a sensitizing layer and is an amorphous Se-Te-As layer which has a thickness of
20 to 150 nm (200 to 1500 Å), and in which the mean tellurium content lies within
the range of from 20 to 50 % by mass, and the mean arsenic content is less than 5
% by mass. The third photoconductive layer is an amorphous Se-As layer, in which the
mean arsenic content is less than 15 % by mass. Finally, a porous Sb₂S₃ film is deposited
on the photoconductive film to a thickness of 40 to 100 nm (400 to 1000 Å) in an inert
atmosphere kept at a pressure of 1.3 Pa (10⁻² Torr), to be used as an electron beam
landing layer. Thus, a photoconductive target having a normalized capacity of more
than 15 µF/m² is obtained. In the above-mentioned photoconductive film most of incident
light is absorbed by the first and second photoconductive layers. Accordingly, even
when the third photoconductive layer is made thin to increase the normalized capacity
thereof, the sensitivity of the photoconductive film is not decreased.
[0036] The above photoconductive target, an electron gun, a mesh electrode and an electrode
structure for focusing and deflecting the electron beam are mounted within a glass
bulb, which is then evacuated. In this pick-up tube, the electron gun is of a diode
type, the beam limiting aperture has a cross-section such as (enlarged) shown in Fig.
4a, that is, the cross-section profile of the portion of the aperture which is parallel
to its center axis, is shaped polygon-like and defined by two straight lines on both
sides of the center axis, the minimum diameter of the beam limiting aperture being
10 µm; the mesh electrode is formed of a 1500 to 2000-mesh copper screen, and the
distance between the mesh electrode and the photoconductive target lies in the range
of from 1 to 2 mm.
[0037] The pick-up tubes explained in the embodiments I and II are preferred embodiments
of the present invention. However, these embodiments have been described for explaining
the technical concept of the present invention. Accordingly, it is to be understood
that the present invention is not limited to the specific embodiments described above.
1. A TV pick-up tube comprising:
a photoconductive film (5) for converting an optical image into electric signals,
the film being made of amorphous semiconductor material at least a portion of which
contains selenium as its main component, and having a capacity of 15 to 150 µF/m²,
a mesh electrode (6) disposed so as to confront the photoconductive film (5), and
a diode type electron gun (1, 3) for emitting a scanning electron beam (2) which is
provided with a beam limiting aperture (4) limiting the diameter of the emitted electron
beam and having a diameter of 5 to 25 µm.
2. The pick-up tube according to claim 1, wherein the thickness of the amorphous photoconductive
film (5) is 0,35 to 3,5 µm.
3. The pick-up tube according to claim 1 or 2 wherein the beam limiting aperture (4)
is tapered in the direction opposite to the propagation direction of the electron
beam (2).
4. The pick-up tube according to one of claims 1 to 3, wherein the cross-section profile
of the portion of the beam limiting aperture (4) which is parallel to its center axis,
is defined by a polygon-like plurality of straight lines on both sides of the center
axis (Fig.4a).
5. The pick-up tube according to one of claims 1 to 3, wherein the cross-section profile
of the portion of the beam limiting aperture (4) which is parallel to its center axis,
is defined by a curved line on both sides of the center axis (Fig. 4b).
6. The pick-up tube according to one of claims 1 to 3, wherein the cross-section of the
enlarged portion of the beam limiting aperture (4) which is parallel to its center
axis, is defined by two straight lines, on one side of the center axis (Fig. 4a).
7. The pick-up tube according to one of claims 1 to 6, wherein the distance between the
photoconductive film (5) and the mesh electrode (6) is 1 to 3 mm.
8. The pick-up tube according to one of claims 1 to 7, wherein the diameter of the beam
limiting aperture (4) is ≦ 15 µm for a 2/3 in. (1,7 cm) pick-up tube and is ≦ 25 µm
for a 1 in. (2,54 cm) pick-up tube, and is ≧ 5 µm in all cases.
1. Fernsehaufnahmeröhre, umfassend
einen photoleitenden Film (5) zur Umwandlung eines optischen Bildes in elektrische
Signale, wobei der Film aus einem amorphen Halbleitermaterial, das zumindest teilweise
Selen als seinen Hauptbestandteil enthält, besteht und eine Kapazität von 15 bis 150
µF/m² aufweist,
eine Maschenelektrode (6), die so angeordnet ist, daß sie dem photoleitenden Film
(5) gegenüberliegt, und
eine Elektronenkanone (1, 3) vom Diodentyp zur Emission eines Abtastelektronenstrahls
(2), die mit einer den Strahl begrenzenden Öffnung (4), die den Durchmesser des Stahls
der emittierten Elektronen begrenzt und einen Durchmesser von 5 bis 25 µm aufweist,
ausgerüstet ist.
2. Aufnahmeröhre nach Anspruch 1, wobei die Dicke des amorphen photoleitenden Films (5)
0,35 bis 3,5 µm beträgt.
3. Aufnahmeröhre nach Anspruch 1 oder 2, wobei sich die den Strahl begrenzende Öffnung
(4) in der der Ausbreitungsrichtung des Elektronenstrahls (2) entgegengesetzten Richtung
verjüngt.
4. Aufnahmeröhre nach einem der Ansprüche 1 bis 3, wobei das Querschnittsprofil des Teils
der den Strahl begrenzenden Öffnung (4), der parallel zu seiner Mittelachse verläuft,
durch eine polygonartige Mehrzahl von Geraden auf beiden Seiten der Mittelachse definiert
ist (Fig. 4a).
5. Aufnahmeröhre nach einem der Ansprüche 1 bis 3, wobei das Querschnittsprofil des Teils
der den Strahl begrenzenden Öffnung (4), der parallel zu seiner Mittelachse verläuft,
durch eine gekrümmte Linie auf beiden Seiten der Mittelachse definiert ist (Fig. 4b).
6. Aufnahmeröhre nach einem der Ansprüche 1 bis 3, wobei der Querschnitt des vergrößerten
Teils der den Strahl begrenzenden Öffnung (4), der parallel zu seiner Mittelachse
verläuft, durch durch zwei Geraden auf einer Seite der Mittelachse definiert ist (Fig.
4a).
7. Aufnahmeröhre nach einem der Ansprüche 1 bis 6, wobei der Abstand zwischen dem photoleitenden
Film (5) und der Maschenelektrode (6) 1 bis 3 mm beträgt.
8. Aufnahmeröhre nach einem der Ansprüche 1 bis 7, wobei der Durchmesser der den Strahl
begrenzenden Öffnung (4) bei einer 2/3 in. (1,7 cm) Aufnahmeröhre ≦ 15 µm, bei einer
1 in. (2,54 cm) Aufnahmeröhre ≦ 25 µm und in allen Fällen ≧ 5 µm ist.
1. Tube de prise de vues de télévision comprenant :
une pellicule photoconductrice (5) pour convertir une image optique en des signaux
électriques, la pellicule étant formée d'un matériau semiconducteur amorphe, dont
au moins une partie contient du sélénium comme constituant principal, et possédant
une capacité de 15 à 150 µF/m²,
une électrode à mailles (6) disposée en vis-à-vis de la pellicule photoconductrice
(5), et
un canon à électrons du type diode (1, 3) pour émettre un faisceau d'électrons de
balayage (2), qui comporte une ouverture (4) de limitation du faisceau, qui limite
le diamètre du faisceau d'électrons émis et possède un diamètre de 5 à 25 µm.
2. Tube de prise de vues selon la revendication 1, dans lequel l'épaisseur de la pellicule
photoconductrice amorphe (5) est comprise entre 0,35 et 3,5 µm.
3. Tube de prise de vues selon la revendication 1 ou 2, dans lequel l'ouverture (4) de
limitation du faisceau se rétrécit dans la direction opposée à la direction de propagation
du faisceau d'électrons (2).
4. Tube de prise de vues selon l'une des revendications 1 à 3, dans lequel le profil
en coupe transversale de la partie de l'ouverture (4) de limitation du faisceau, qui
est parallèle à son axe central, est défini par une pluralité de droites disposées
selon un polygone, des deux côtés de l'axe central (figure 4a).
5. Tube de prise de vues selon l'une des revendications 1 à 3, dans lequel le profil
en coupe transversale de la partie de l'ouverture (4) de limitation du faisceau, qui
est parallèle à son axe central, est défini par une ligne courbe des deux côtés de
l'axe central (figure 4b).
6. Tube de prise de vues selon l'une des revendications 1 à 3, dans lequel la section
transversale de la partie élargie de l'ouverture (4) de limitation du faisceau, qui
est parallèle à son axe central, est définie par deux droites, d'un côté de l'axe
central (figure 4a).
7. Tube de prise de vues selon l'une des revendications 1 à 6, dans lequel la distance
entre la pellicule photoconductrice (5) et l'électrode à mailles (6) est comprise
entre 1 et 3 mm.
8. Tube de prise de vues selon l'une des revendications 1 à 7, dans lequel le diamètre
de l'ouverture (4) de limitation du faisceau est ≦ 15 µm pour un tube de prise de
vues de 2/3 pouce (1,7 cm) et est ≦ 25 µm pour un tube de prise de vues de 1 pouce
(2,54 cm) et est ≧ 5 µm dans tous les cas.