INTEGRATED CIRCUITS AND METHOD OF TESTING SAME - Patent 0277167

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EP 0 277 167 A1

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(43)	Date of publication:
	10.08.1988 Bulletin 1988/32

(21)	Application number: 87904906.0

(22)	Date of filing: 25.07.1987

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International Patent Classification (IPC):

G01R 31/ 26^{( . )}
G01R 31/ 3185^{( . )}

G01R 31/ 28^{( . )}
H01L 21/ 66^{( . )}

(86)	International application number:
	PCT/GB1987/000530

(87)	International publication number:
	WO 1988/001060 (11.02.1988 Gazette 1988/04)

(84)	Designated Contracting States:
	CH DE FR GB IT LI NL

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Priority:

25.07.1986 GB 19860018210

(71)	Applicant: PLESSEY OVERSEAS LIMITED
	Ilford Essex IG1 4AQ (GB)

(72)	Inventor:
	PHILIPS, Ian Woolwell Plymouth (GB)

(74)	Representative: Elliott, Frank Edward
	The Plessey Company plc. Intellectual Property Department Vicarage Lane Ilford, Essex IG1 4AQ Ilford, Essex IG1 4AQ (GB)

(54)	INTEGRATED CIRCUITS AND METHOD OF TESTING SAME