METHOD AND APPARATUS FOR MEASURING OF TRANSIENTS OF HIGH-FREQUENCY CIRCUITS BY SAMPLING - Patent 0413015

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EP 0 413 015 A1

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(43)	Date of publication:
	20.02.1991 Bulletin 1991/08

(21)	Application number: 90903396.0

(22)	Date of filing: 22.02.1990

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International Patent Classification (IPC):

G01R 13/ 32^{( . )}

G01R 13/ 34^{( . )}

(86)	International application number:
	PCT/HU1990/000014

(87)	International publication number:
	WO 1990/010239 (07.09.1990 Gazette 1990/21)

(84)	Designated Contracting States:
	DE FR GB NL

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Priority:

22.02.1989 HU 19890000847

(71)	Applicant: MIKI Méréstechnikai Fejleszto Vállalat
	H-1122 Budapest (HU)

(72)	Inventors:
	DAKA, Miklós H-1037 Budapest (HU) SOMOGYI, Gyula H-1098 Budapest (HU) SZALAY, Tibor H-9300 Csorna (HU)

(74)	Representative: Einsel, Martin, et al
	Patentanwalt Dipl.-Phys. M. Einsel Jasperallee 1A D-38102 Braunschweig D-38102 Braunschweig (DE)

(54)	METHOD AND APPARATUS FOR MEASURING OF TRANSIENTS OF HIGH-FREQUENCY CIRCUITS BY SAMPLING