TESTING OF ANALOGUE CIRCUITS IN SEMICONDUCTOR DEVICES - Patent 0416047

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EP 0 416 047 A1

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(43)	Date of publication:
	13.03.1991 Bulletin 1991/11

(21)	Application number: 90900272.0

(22)	Date of filing: 24.11.1989

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International Patent Classification (IPC):

G01R 31/ 28^{( . )}
H01L 21/ 66^{( . )}

G01R 31/ 3167^{( . )}

(86)	International application number:
	PCT/GB1989/001408

(87)	International publication number:
	WO 1990/006521 (14.06.1990 Gazette 1990/14)

(84)	Designated Contracting States:
	DE FR GB IT NL

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Priority:

25.11.1988 GB 19880027629

(71)	Applicant: LSI LOGIC EUROPE PLC
	Bracknell, Berkshire RG12 1BP (GB)

(72)	Inventor:
	WALLER, David, Leonard 40 Henley Meadows Kent TN30 6EP (GB)

(74)	Representative: Thomson, Roger Bruce, et al
	POLLAK MERCER & TENCH Eastcheap House Central Approach Letchworth Hertfordshire SG6 3DS Letchworth Hertfordshire SG6 3DS (GB)

(54)	TESTING OF ANALOGUE CIRCUITS IN SEMICONDUCTOR DEVICES