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(11) | EP 0 429 309 A3 |
(12) | EUROPEAN PATENT APPLICATION |
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(54) | Biasing scheme for improving latitudes in the tri-level xerographic process |
(57) The operating latitude of the tri-level xerographic process is improved by replacing
the standard DC bias that is applied to one or both of the developer housings (32,
34) in conventional tri-level imaging with a chopped DC (CDC) developer bias (41,
43). Chopped DC biasing is the alternate application of two discrete bias voltages
to a developer strucrute in a periodic fashion at a given frequency, with the period
of each cycle divided up between the two bias levels at a duty cycle of from 5-10%
or 90-95% depending upon which of the two developer structures is being biased. In
the case of the DAD developer structure (32) the duty cycle of the higher of the two
biases is 5-10% and in the case of a CAD developer structure (34) the duty cycle of
the higher of the two biases is 90-95%. The apparatus can be switched to operate in
a black monochrome mode, in which only the black developer structure (34) is biased
using a standard momchrome bias (4-5). |