[0001] The invention relates to a picture display device comprising a display tube having
a display screen and an electron gun arranged opposite said screen, with a cathode
centred along an electron-optical axis and a plurality of electrodes which jointly
constitute an electron beam-producing part, said gun further comprising a tubular
structure having an outer surface and an inner surface on which a resistance structure
of a material having a high electrical resistance is provided, which structure constitutes
a focusing lens.
[0002] Lately, research efforts have been made regarding the use of a main focusing lens
constituted by a (particularly helical) high-ohmic resistance structure in display
tubes in order to obtain a low spherical aberration. The resistance structure has
at least one contact for supplying a static focusing voltage and at least one contact
for supplying an anode voltage.
[0003] However, when a dynamic correction signal together with the static focusing signal
is to be supplied, the desired effect which was to be expected on grounds of previous
experiences with conventional focusing tubes does not occur, particularly not at scan
frequencies exceeding 16 kHz. (Correction by applying a dynamic focusing voltage may
be necessary, for example in the case of large deflection angles so as to keep the
electron beam in focus throughout the screen. In the corners a focusing voltage is
required which is different from that in the centre of the screen. This means that
the dynamic focusing voltage is a signal varying with the scan frequency whose intensity
is a function of the position of the electron beam spot on the screen.)
[0004] It is an object of the invention to provide a picture display device comprising a
display tube with an electrostatic lens, such as a focusing lens, of the helical resistance
type, which is particularly suitable for using dynamic correction signals.
[0005] To this end a picture display device according to the invention is characterized
in that the resistance structure has at least two electric contacts which are axially
spaced apart and are adapted to be connected to first voltage-providing means for
applying an anode voltage and is electrically connected to a low-ohmic electrode means
arranged between said electric contacts, which means is adapted to be connected to
second voltage-providing means for applying a static focusing voltage and a dynamic
correction voltage. The low-ohmic electrode means may consist of one or more discrete
metal components or of an electrically conducting layer.
[0006] The invention is based,
inter alia on the recognition that the high resistance of the (helical) lens structure leads
to a long intrinsic RC time of the resistance layer, even at those locations where
the layer does not form a helical structure but is homogeneous. In other words, the
focusing signal does not propagate or hardly propagates in the resistance structure.
[0007] An essential aspect of the invention is that the electrical connection of the high-ohmic
resistance structure to the above-described low-ohmic electrode means provides a region
having an RC time which is decreased to such an extent that the dynamic correction
signal can spread sufficiently far across the main focusing lens in the central part
of the focusing lens. As will be described in greater detail, the intermediate electrode
means may consist of, for example a coaxial metal ring, one or more transversal metal
plates having a beam-passing aperture or of a thin conducting layer provided on the
inner wall of the tubular structure and/or on the inner surface of the resistance
structure. Vapour deposition, sputtering or painting are examples of suitable techniques
for providing the thin conducting layer. It appears that dynamic correction signals
(such as, for example dynamic focusing signals) having frequencies up to the MHz range
now provide the desired effect.
[0008] A construction enabling the low-ohmic intermediate electrode to be provided in a
simple manner is characterized in that the tubular structure comprises at least two
aligned sub-tubes each having resistance structures which jointly constitute a main
focusing lens and in that the low-ohmic electrode means consists of at least one metal
plate having a beam-passing aperture, which plate is arranged transversely between
the facing ends of the sub-tubes.
[0009] An embodiment of this construction is characterized in that the beam-producing part
comprises a correction means for correcting possible alignment errors of the sub-tubes.
[0010] An alternative construction with which alignment errors are obviated is characterized
in that the tubular structure comprises a single tube having a resistance structure
provided on its inner surface, which structure constitutes a focusing lens, in that
an annular structure of electrically conducting material making electrical contact
with the resistance structure is arranged within said tube, which annular structure
constitutes the low-ohmic electrode means, and in that the annular structure is connected
to an electric contact
via an aperture in the wall of the tube.
[0011] For dynamic focusing the low-ohmic intermediate electrode is constructed to exercise
a rotationally symmetrical effect on the electron beam.
[0012] For dynamic and astigmatic focusing the low-ohmic intermediate electrode should be
constructed to exercise a non-rotationally symmetrical effect.
[0013] Some embodiments of a picture display device according to the invention will now
be described in greater detail with reference to the drawing in which
Fig. I shows diagrammatically a cross-section of a picture display device comprising
a display tube according to the invention;
Fig. 2 is an elevational view of a longitudinal cross-section through a part of a
focusing lens of an electron gun suitable for use in the display tube of Fig. 1;
Fig. 3 shows a basic diagram of a first embodiment of a focusing lens which can be
used in an electron gun;
Fig. 4 shows a basic diagram of a second embodiment of a focusing lens which can be
used in an electron gun;
Figs. 5, 6 and 7 show realisations of the basic diagram of Fig. 3;
Fig. 8 shows an alternative realisation of the basic diagram of Fig. 3;
Fig. 9 is a longitudinal section of a part of a focusing lens having an electrode
means which exercises a non-rotationally symmetrical effect; and
Figs. 10, 11 and 12, 13 show alternatives to the construction shown in Fig. 9.
Fig. 14 shows an alternative use of the invention.
[0014] The device shown in Fig. 1 comprises a cathode ray tube consisting of,
inter alia a glass envelope 1 which is composed of a display window 2, a conical portion 3 and
a neck 4. This neck accommodates electrode structures 8 and 9 which together with
a cathode constitute the beam-producing part 43 of an electron gun. The electron-optical
axis 6 of the electron gun is also the axis of the envelope. An electron beam 12 is
successively formed and accelerated by the cathode 7 and the electrode structures
8, 9. The reference numeral 10 denotes a tubular structure whose inner surface carries
a (particularly helical) structure 11 of a material having a very high electrical
resistance which forms a focusing lens focusing the beam on a display screen 14 on
the inner side of the display window 2. The resistance structure 11 is electrically
connected to a low-ohmic metal input electrode 13a and a low-ohmic metal output electrode
13b. In the case of a so-called unipotential lens suitable voltages to be applied
to the electrodes are, for example:
- cathode 7
- several tens of Volts (for example 50V)
- electrode 8
- 0 V
- electrode 9
- several hundreds of Volts (for example 400 V)
input and output focusing lens several tens of kilovolts (for example 30 kV) central
part focusing lens several kilovolts (for example 5 kV). The electron beam 12 is deflected
by means of a system 5 of deflection coils from the axis 6 across the display screen
14. Display screen 14 consists of a phosphor layer which is coated with a thin aluminium
film which is electrically connected to the end of electrode 11
via a conducting coating on the inner wall of the conical portion 3.
[0015] For applying a focusing voltage in the central part of the focusing lens a low-ohmic
electrode is required within the scope of the invention. This electrode may be constructed
in different manners. Examples will be given with reference to Figs. 5, 6, 7 and 8.
[0016] Some details of the construction of a focusing lens of a type suitable for use in
an electron gun of the display tube of Fig. 1 will be described with reference to
Fig. 2. The type in question comprises a tubular (glass) envelope 15. The inner side
of the envelope 15 whose ends are provided with transversal metal electrode plates
17a, 17b having central coaxial apertures 18a, 18b carries a high-ohmic resistance
layer 16 in which a helical structure is formed which constitutes a focusing lens
17 when a suitable electric voltage is applied. The patterns of parallel oblique lines
diagrammatically represent the locations where the resistance layer 16 has been omitted.
The parts of the helical structure are thus always present between two of these lines.
The high-ohmic resistance layer 16 may consist of, for example glass enamel having
a small amount (for example several % by weight) of metal oxide (particularly ruthenium
oxide) particles. The layer 16 may have a thickness of between 1 and 10 νm, for example
3 νm. The resistance per square of such a layer depends on the concentration of metal
oxide and the heat treatment to which the layer is subjected. In practice resistances
per square varying between 10⁴ and 10⁸ Ω have been realised. A desired resistance
per square can be realised by adjusting the relevant parameters. A resistance per
square of the order of 10⁶ Ω is very suitable for the relevant application. The total
resistance of the helical structure formed in the layer 16 (which structure may comprise
a continuous helix as well as a number of separate helixes connected by segments without
a helical structure - 6 in the example of Fig. 2) may be of the order of 10 G Ω, which
means that a current of several mA will flow across the ends at a voltage difference
of 30 kV. In this Figure and in all other Figures the (oblique) line patterns indicate
the locations of the resistance layer where the material has been removed from the
resistance layer by means of, for example, a rotating cutting tool.
[0017] The electron gun of Fig. 1 has a beam-producing part 43 preceding the focusing lens
17, which part generally comprises a cathode 7, a grid electrode 8 and an anode 9.
In the case of Fig. 1 the components of the beam-producing part 43 are separately
mounted in the display tube, for example, by means of axial glass- ceramic mounting
rods. Alternatively, they may be mounted within the tubular envelope 10 of the focusing
lens.
[0018] It may be necessary to correct occurring picture errors by means of dynamic focusing.
The power of the electron lens for focusing the electron beam is adjusted as a function
of the deflection to which the electron beam is subjected at that instant. This provides
the possibility of causing the main picture plane which is then prevalent to intersect
the display screen at the location where the electron beam impinges upon the display
screen. This correction mode requires an extra circuit in the control device for generating
the correct dynamic focusing voltages on the electrodes of the focusing lens.
[0019] Since the material of the helical resistance structure has such a high electrical
resistance (for example 10 G Ω), the RC time is long (for example 10 msec). As a result,
the effect of a dynamic focusing voltage applied to electrode 18a will hardly reach
the helical resistance structure. The invention provides a solution in this respect.
The principle of this solution will be elucidated with reference to Figs. 3 and 4
showing two designs of focusing lenses which are suitable for use in an electron gun
for a picture display device according to the invention.
[0020] Only two electric supply leads are required for the two types of focusing lenses:
an anode lead and a focus lead.
[0021] Fig. 3 shows diagrammatically a helical focusing lens in which an anode voltage V
a is applied to the ends and a focusing voltage V
f is applied to the central part (so-called unipotential lens). A characteristic feature
of a unipotential lens design is that, in contrast to a bipotential lens design, the
voltages across the object-sided lens portion and the image-sided lens portion are
equal. The resistance structures of these two portions may be symmetrical. Each structure
has, for example 5 helical segments.
[0022] Fig. 4 shows diagrammatically a helical focusing lens in which an anode voltage V
a is applied to one end and to a first part located between the ends, and a focusing
voltage V
f is applied to the other end and to a second part located between the ends (so-called
quadripotential lens).
[0023] Such a lens may have an object-sided potential at the focusing voltage, followed
by a trajectory where the potential increases to the anode voltage and then the potential
may decrease to the focusing voltage and increase again to the anode voltage on the
last trajectory.
[0024] Other types of "multipotential" lenses are also applicable.
[0025] The voltages can be applied, for example by making an aperture in the wall of the
glass tube at each desired location, which glass tube carries the resistance structure
on its inner surface, and by providing an electric contact in this aperture (for example
an indium pellet) which makes contact with the resistance layer. Instead of this type
of electric contact a metal flange making electrical contact with the resistance layer
can be provided at the ends of the glass tube.
[0026] However, within the scope of the invention, the electrode for applying a dynamic
correction signal should always be a low-ohmic intermediate electrode electrically
connected to the resistance layer.
[0027] An embodiment of the lens design of Fig. 3 is shown in Fig. 5. The resistance lens
construction shown in this Figure comprises a sub-tube 21 and a sub-tube 22. Metal
flanges (for example flanges of CrFe) 23, 24 each having a coaxial aperture are sealed
to the ends of sub-tube 21 and metal flanges 25, 26 each having a coaxial aperture
are sealed to the ends of the sub-tube 22. The flanges 23, 26 serve for applying the
anode voltage V
a. In the manner described with reference to Fig. 2 high-ohmic resistance layers 27,
28 having a helical structure are arranged in the sub-tubes 21, 22. The flanges 24,
25, each of which has a beam-passing aperture, are welded together and jointly constitute
a low-ohmic intermediate electrode which serves for applying the (static + dynamic)
focusing voltage V
f.
[0028] Fig. 6 shows a substantially identical structure. However, in this case the facing
flanges 24, 25 are not welded together, but arranged in a mutually electrically insulated
manner (for example, by mounting on glass or ceramic rods which are not shown). This
provides the possibility of applying a static plus a dynamic focusing voltage V
f (stat + dyn) to, for example flange 25 and a static focusing voltage V
f (stat) to flange 24. In the constructions shown in Figs. 5 and 6 the metal flanges
24, 25 having coaxial central apertures 29, 30 function as low-ohmic electrodes. The
apertures 29, 30 may have a rotationally symmetrical shape, as in Fig. 5. If the apertures
29, 30 have a non-rotationally symmetrical shape, for example a square or elongate
(oval or rectangular) shape, as in Fig. 6, an electric 4-pole field forming an astigmatic
lens is formed in between them upon energization. The applied dynamic focusing voltage
has a diverging effect on an electron beam passing through the focusing lens, both
in the horizontal and in the vertical direction. This diverging effect can be compensated
in the horizontal direction and increased in the vertical direction by the astigmatic
lens which is formed between the flanges 24, 25 when the dynamic and static focusing
voltages are applied. This renders an independent horizontal and vertical focusing
possible, which is particularly important in color display tubes. (Here, dynamic astigmatic
focusing is concerned).
[0029] Fig. 7 shows a structure which is substantially identical to the structure of the
focusing lens of Fig. 6. In this case, however, an extra transversal electrode 31
is arranged between the flanges 24 and 25. The required static and dynamic focusing
voltages can now be applied to the electrodes 24, 25 and 31.
[0030] Fig. 9 shows a part of a focusing lens construction with a low-ohmic electrode means
comprising two metal flanges 24' and 25' each having a beam-passing aperture and engaging
projections 42, 43, 44 and 45 whereby, upon energization, a 4-pole field is generated
between the flanges.
[0031] In the cases of Figs. 5, 6, 7 and 9 the focusing lens always comprises at least two
sub-tubes having a resistance structure. This could give rise to misalignment of the
sub-tubes. Possibly occurring misalignments can be corrected by a correction means
particularly arranged in front of the focusing lens. The desired correction is realised,
for example, by providing a ring 42 of permanently magnetizable material in the last
electrode of the beam-producing part of the electron gun (electrode 9 in Fig. 1) and
by magnetizing this ring from the exterior after the electron gun has been mounted
in the display tube. It appears from Figs. 5, 6 and 7 that the metal flanges 24, 25
(and 31) are comparatively close to the through-connection wire 32 applying the anode
(high) voltage to flange 23. Since the flanges 24, 25 (and 31) convey the (lower)
focusing voltage, this may give rise to unwanted field emission ("spraying") of the
flanges 24, 25 (and 31) to the through-connection wire 32, particularly when the flanges
are rough (or have projections). To prevent this, it should be ensured that the components
conveying different voltages do not "see" one another, for example, by insulating
the connection wire by oxidizing the material of which it is made or by coating it
with an insulating layer. However, an electrically insulating protective coating is
preferably provided on the components conveying the lowest voltage (
i.e. the flanges 24, 25 (and 31)). A thin layer of ceramic material or of glass is suitable
for insulation. In the latter case, for example aluminium phosphate glass is a good
choice. This may be provided in a thin layer and has a high viscosity already at a
relatively low temperature. Consequently, a great degree of freedom with respect to
the coefficients of expansion of the metal to be coated and the glass is admissible.
Also in the case of the relatively high viscosity and a snall thickness (of the order
of microns) of the layer, this layer will easily follow possible irregularities of
the surface on which it is provided and thus coat this surface satisfactorily. An
alternative example is to manufacture the flanges 24, 25 (and 31) from a chromium-containing
material and to subject it to an oxidation treatment.
[0032] Another way of preventing the occurrence of unwanted field emission is explained
with reference to Fig. 8.
[0033] Instead of two (or more) sub-tubes (for example two tubes having a length of 35 mm
each) the focusing lens 33 comprises one single tube 34 (having a length of, for example
70 mm) in this case. The inner surface of tube 34 is provided, for example in the
manner described hereinbefore with a high-ohmic resistance layer 35 having a helical
pattern and its ends may be provided with flanges 36, 37 which are electrically connected
thereto and are intended to apply an anode voltage V
a. The tube 34 accommodates a coaxial metal ring 38 (for example of CrNi) which is
in (clamping) engagement and in electrical contact with a part of the resistance layer
35 in which no helical pattern has been provided. Focus lead 40 is welded (for example
by means of laser welding) to the clamping ring 38 functioning as a focusing electrode
via an aperture 39 (of, for example 1.5 x 3 mm) in the wall of the tube 34, which aperture
is made (for example by means of sandblasting) preferably after the resistance layer
35 is provided. In this construction the wall of the tube 34 shields the focusing
electrode 38 from anode through-connection wire 41, thus preventing the above-mentioned
field emission problem. The width of the focusing electrode (clamping ring 38 in this
case) determines to a considerable extent the region where dynamic focusing takes
place. Also the width of the uninterrupted part of the resistance layer 35 located
between the helical portions plays a role if this width deviates from the width of
the focusing electrode. Static focusing takes place throughout the length of the helical
pattern.
[0034] To prevent possible high-voltage problems, it is important that the focus lead 40
does not "see" the high-voltage through-connection wire 41. To achieve this, it is
useful to provide the aperture 39 in a position which is rotated through an angle
of between 120° and 180° with respect to the position of the wire 41.
[0035] In its simplest form the coaxial focusing ring 38 is rotationally symmetrical so
as to render the use of dynamic focusing possible. Within the scope of the invention
rotationally symmetrical rings are not only understood to mean (closed) rings whose
circumference exactly follows a circular path, but also (open) substantially circular
rings with two ends which slightly overlap or with two ends which are located opposite
each other in one plane, either with the inclusion of a small gap or by means of a
butt joint.
[0036] Instead of a discrete ring (38) a layer or a tape of electrically conducting (low-ohmic)
material can be used as a focusing electrode. Such a layer can be provided on the
inner wall of the tube 34 before the high-ohmic resistance structure 35 is provided.
An alternative method is to provide the high-ohmic resistance structure 35 and to
coat it with a layer of electrically conducting material, for example a layer of electrically
conductive paint sold under the name of "Leitsilber".
[0037] As already noted hereinbefore, the invention can be used for dynamic astigmatic focusing,
for which purpose an electric 4-pole field is generated in the focusing lens range.
However, it may also be used for generating other dynamic multipole fields in the
focusing lens range, for example, a dynamic dipole field (for beam displacement).
[0038] The inventive principle of ohmically coupling in a dynamic signal into a resistance
lens may be used advantageously in a projection TV tube, but the principle may also
be used in color display tubes. Another possibility is its Use in oscilloscope tubes
in which the high-frequency deflection could be effected, for example by means of
a signal which is ohmically coupled in, similarly as the dynamic focusing signal.
[0039] Dynamic
astigmatic
focusing may be carried out in manners differing from those described hereinbefore,
for example, in the manner shown in Fig. 10. In this case the resistance layer 46
of the focusing lens is interrupted over an intermediate area 47 of several millimetres.
In this area the inner wall of the tubular structure 50 carries two metal electrodes
48, 49 which have engaging projections of several millimetres' length. Each electrode
48, 49 slightly overlaps the resistance layer 46 so as to establish electrical contact
therewith. The electrodes may be made of, for example, a layer of a low-ohmic material
provided by way of an electroless or a vapour-deposition process, in which the finger
structure is provided by means of etching or by a laser. The support may be a synthetic
material foil. Electrodes of the type 24', 25' shown in Fig. 9 are alternatively possible.
Fig. 11 shows the area 47 and its direct surroundings in greater detail. A voltage
V
f, (stat) is applied to the electrode 48 and a voltage V
f (stat + dyn) is applied to the electrode 49.
[0040] Fig. 12 shows a simpler solution. Here the resistance layer 46, in which the helical
pattern is formed, is not interrupted over a given (intermediate) area (as in the
constructions shown in Figs. 5, 6, 7, 9, 10 and 11), but it continues as in the construction
shown in Fig. 8. A finger structure is formed by means of a scratch 51 in the resistance
layer 46. (There may be a plurality of parallel scratches so as to reduce the voltage
drop per scratch.) An annular structure in the form of two tape-shaped metal electrodes
52, 53 is provided on both sides at a short distance (several mm) from this scratch.
These electrodes are energized in the same way as the electrodes shown in Fig. 11.
By making the distance between these tape-shaped electrodes and the ends of the fingers
sufficiently small, it is possible for the DAF signal to enter into the ends of the
fingers. This solution has the advantage that the accuracy is determined by the scratch
in the resistance layer and is not determined by the position or the shape of the
tape-shaped electrodes.
[0041] DAF is possible at the line frequency as well as at the field frequency, when the
latter two solutions are employed. Another advantage is that DAF electrodes having
a finger structure are very effective.
[0042] A further refinement (see Fig. 13) is to replace the rectangular finger (or square-wave)
structure by a more gradual profile such as a sin2φ function. Such a scratch 54 is
easier to provide and will result in fewer lens errors. Here, too, use is made of
tape-shaped electrodes 52' and 53' to which respective voltages V
f (stat) and V
f (stat + dyn) are applied.
[0043] The invention is generally based on the recognition that the high resistance of the
resistance structure leads to a long intrinsic RC time, even at those locations where
the layer does not form a helical structure, so that a H.F. correction signal, such
as a dynamic focusing signal, does not enter or hardly enters into the resistance
structure. This also holds in the case where a portion of the resistance structure
outside the focusing lens portion constitutes a correction element. This may be a
correction element of a type described hereinbefore, or a cylindrical element 60 which
has a plurality of circumferentially arranged parts (for example, 2, 4 or 8), each
of which is adapted to be connected to voltage-providing means for applying a correction
voltage and each of which is in contact with a low-ohmic electrode means for decreasing
its resistance (see Fig. 14). Each low-ohmic electrode means should at least be in
contact with its own correction element part in the area of the voltage contact. If
desired, the correction element parts can be electrically connected to the resistance
structure portion constituting a focusing lens.
[0044] A further aspect of the invention thus is that contacting each individual portion
of the high-ohmic correction element with a low-ohmic electrode means provides a region
having an RC time which is decreased to such an extent that the dynamic correction
signal can spread fast enough across the correction element to be effective. The low-ohmic
electrode means may consist of, for example, a thin conducting layer provided on the
inner wall of the tubular structure. Vapour deposition, sputtering or painting are
examples of suitable techniques for providing the thin conducting layer. It appears
that dynamic correction signals (such as, for example dynamic focusing signals) having
frequencies up to the MHz range now provide the desired effect.
1. A picture display device comprising a display tube having a display screen and an
electron gun arranged opposite said screen, with a cathode centred along an electron-optical
axis and a plurality of electrodes which jointly constitute an electron beam-producing
part, said gun further comprising a tubular structure having an outer surface and
an inner surface on which a resistance structure of a material having a high electrical
resistance is provided, which structure constitutes a focusing lens, characterized
in that the resistance structure has at least two electric contacts which are axially
spaced apart and are adapted to be connected to first voltage-providing means for
applying an anode voltage and is electrically connected to a low-ohmic electrode means
arranged between said electric contacts, which means is adapted to be connected to
second voltage-providing means for applying a static focusing voltage and a dynamic
correction voltage.
2. A display device as claimed in Claim 1, characterized in that the tubular structure
comprises at least two aligned sub-tubes each having resistance structures which jointly
constitute a focusing lens and in that the low-ohmic electrode means consists of at
least one metal plate having a beam-passing aperture, which plate is arranged transversely
between the facing ends of the sub-tubes.
3. A display device as claimed in Claim 2, characterized in that the beam-producing part
comprises a correction means for correcting possible alignment errors of the sub-tubes.
4. A display device as claimed in Claim 1, characterized in that the tubular structure
comprises a single tube having a resistance structure provided on its inner surface,
which structure constitutes a focusing lens, in that an annular structure of electrically
conducting material making electrical contact with the resistance structure is arranged
within said tube, which annular structure constitutes the lowohmic electrode means,
and in that the annular structure is connected to an electric contact via an aperture in the wall of the tube.
5. A display device as claimed in Claim 1, 2 or 4, characterized in that, upon energization,
the low-ohmic electrode means exercises a non-rotationally symmetrical effect on the
electron beam.
6. A picture display device comprising a display tube having a display screen and an
electron gun arranged opposite said screen, with a cathode centred along an electron-optical
axis and a plurality of electrodes which jointly constitute an electron beam-producing
part, said gun further comprising a tubular structure having an inner surface on which
a resistance structure of a material having a high electrical resistance is provided,
characterized in that the resistance structure has at least two circumferentially
arranged parts which constitute a correction element, each part being adapted to be
connected to voltage-providing means for applying a correction voltage and each being
in contact with a low-ohmic electrode means for decreasing its resistance.