<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE ep-patent-document PUBLIC "-//EPO//EP PATENT DOCUMENT 1.4//EN" "ep-patent-document-v1-4.dtd"><ep-patent-document id="EP0712484A1" file="EP93917255NWA1.xml" lang="en" doc-number="0712484" date-publ="19960522" kind="A1" country="EP" status="n" dtd-version="ep-patent-document-v1-4"><SDOBI lang="en"><B000><eptags><B001EP>ATBECHDEDKESFRGBGRITLILUNLSEMCPTIE..................................................................</B001EP><B003EP>*</B003EP><B007EP>EPregister to ST.36 EBD process v 1.0 kbaumeister@epo.org (15 Jan 2013)</B007EP></eptags></B000><B100><B110>0712484</B110><B130>A1</B130><B140><date>19960522</date></B140><B190>EP</B190></B100><B200><B210>93917255.0</B210><B220><date>19930719</date></B220><B240><B241><date>19960213</date></B241></B240><B250>en</B250><B251EP>en</B251EP><B260>en</B260></B200><B400><B405><date>19960522</date><bnum>199621</bnum></B405><B430><date>19960522</date><bnum>199621</bnum></B430></B400><B500><B510EP><classification-ipcr sequence="1"><text>G01B   5/   207            A I                    </text></classification-ipcr></B510EP><B540><B541>en</B541><B542>PROFILOMETRY SCANNER MECHANISM</B542><B541>fr</B541><B542>MECANISME DE RELEVE PROFILOMETRIQUE</B542><B541>de</B541><B542>PROFILOMETRISCHER ABTASTMECHANISMUS</B542></B540></B500><B700><B710><B711><snm>Sanchez, Luis R.</snm><adr><str>2842 S.W. 141 Court</str><city>Miami, Florida 33175</city><ctry>JP</ctry></adr></B711></B710><B720><B721><snm>Sanchez, Luis R.</snm><adr><str>2842 S.W. 141 Court</str><city>Miami, Florida 33175</city><ctry>JP</ctry></adr></B721></B720><B740><B741><snm>Williams, John Francis, et al</snm><adr><str>WILLIAMS, POWELL &amp; ASSOCIATES 34 Tavistock Street</str><city>London WC2E 7PB</city><ctry>GB</ctry></adr></B741></B740></B700><B800><B840><ctry>AT</ctry><ctry>BE</ctry><ctry>CH</ctry><ctry>DE</ctry><ctry>DK</ctry><ctry>ES</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>GR</ctry><ctry>IE</ctry><ctry>IT</ctry><ctry>LI</ctry><ctry>LU</ctry><ctry>MC</ctry><ctry>NL</ctry><ctry>PT</ctry><ctry>SE</ctry></B840><B860><B861><dnum><anum>US1993006742</anum></dnum><date>19930719</date></B861><B862>en</B862></B860><B870><B871><dnum><pnum>WO1995003523</pnum></dnum><date>19950202</date><bnum>199506</bnum></B871></B870></B800></SDOBI></ep-patent-document>