(19)
(11) EP 0 740 273 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
23.04.1997 Bulletin 1997/17

(43) Date of publication A2:
30.10.1996 Bulletin 1996/44

(21) Application number: 96302918.6

(22) Date of filing: 25.04.1996
(51) International Patent Classification (IPC)6G06T 17/20
(84) Designated Contracting States:
GB

(30) Priority: 27.04.1995 JP 103969/95
20.06.1995 JP 153277/95
20.06.1995 JP 153278/95

(71) Applicant: CANON KABUSHIKI KAISHA
Tokyo (JP)

(72) Inventor:
  • Sasaki, Toyoshige, c/o Canon K.K.
    Ohta-ku, Tokyo (JP)

(74) Representative: Beresford, Keith Denis Lewis et al
BERESFORD & Co. 2-5 Warwick Court High Holborn
London WC1R 5DJ
London WC1R 5DJ (GB)

   


(54) Method and apparatus for processing finite element meshing model


(57) In a method of detecting a data error in a finite element meshing diagram in which an analytic model is meshed into finite elements, the number of elements having each of boundaries of elements surrounding a node as their own boundaries is counted respectively to check whether the node is positioned inside or on an outer circumference of an element meshing diagram. By using this position information, data error detection is performed for the element meshing diagram. When one side, face, or element is regarded as a segment and this segment is to be extracted from a finite element meshing model, an index value characterizing the combination of nodes constituting each segment is assigned to the segment. A segment list is formed by consecutively arranging pieces of information of segments having the same index value. An index table showing the relationship between the index values and the positions in the segment list also is formed. On the basis of the segment list and the index table, segments having the same index value are extracted to obtain node information. A free face is extracted from an element by checking, for all faces of the element, whether a face of the element is shared by another element. Whether two faces having one side of the element as their own sides are free faces is checked. If both of the two faces are free faces, it is determined that the side is a contour. Whether a side having one node of each element as its own end point is a contour is checked. If all of the sides are contours, it is determined that the node is a vertex.







Search report