TECHNICAL FIELD
[0001] This invention is related to a method and an apparatus for soldering inspection of
a surface mounted circuit board on which components are mounted by soldering. Especially,
this invention is related to a method and an apparatus which inspect whether soldering
condition is good or bad from a X-rays transmission image which is a result of radiating
X-rays.
BACKGROUND ART
[0002] There is one prior method for inspecting whether soldering condition is good or bad
concerning a circuit board-on which surfaces are mounted with components by soldering,
which includes a radiating process for radiating X-rays towards a surface mounted
circuit board, a detecting process for detecting a transmission amount of the radiated
X-rays, an indicating process of indicating the transmission amount by a X-rays transmission
image as a transmission amount distribution concerning different portions of the surface
mounted circuit board, and an inspection process for inspecting whether soldering
condition of the surface mounted circuit board is good or bad from the X-rays transmission
image. It can be judged whether the soldering condition is good or bad since figure
and solder amount of soldering portion can be detected from this X-rays transmission
image. Thus, an information concerning X-rays transmission density is gained from
such a X-rays transmission image, which corresponds to a shielding degree of X-rays
which an radiated object has. The prior method applying the X-rays transmission image
possesses a superior characteristic as a soldering inspection method.
[0003] However, with respect to a circuit board of which both side surfaces are mounted,
it is impossible to inspect soldering conditions only from a X-rays transmission-image.
Because, the transmission images of the both side surfaces overlap each other.
[0004] Therefore, in order to settle this problem, one method and one apparatus for soldering
inspection of a both-side surfaces mounted circuit board are proposed in Japanese
Patent Laid Open 3-218409 and Japanese Patent Laid Open 5-99643, which apply X-rays
transmission images.
[0005] Prior examples of a soldering inspection to the both-side surfaces mounted circuit
board will be simply explained hereinafter, which are proposed in Japanese Patent
Laid Open 3-218409 and Japanese Patent Laid Open 5-99643. Hereon, the both-side surfaces
mounted circuit board means the circuit board of which both side surfaces should be
mounted with components.
[0006] According to the method proposed in the above-mentioned Japanese Patent Laid Open
3-218409, an one-side X-rays transmission image is obtained and memorized. Hereon,
the one-side X-rays transmission image means the X-rays transmission image concerning
a state where one side surface of a both-side surfaces mounted circuit board is only
mounted with components.
[0007] Next, a both-side X-rays transmission image is obtained. Hereon, the both-side X-rays
transmission image means the X-rays transmission image concerning a state where both
side surfaces of the both-side surfaces mounted circuit board are mounted with components.
[0008] And then, an other-side X-rays transmission image is extracted by subtracting the
one-side X-rays transmission image from the both-side X-rays transmission image. Hereon,
an other-side X-rays transmission image means the X-rays transmission image concerning
a state where other side surface of a both-side surfaces mounted circuit board is
only mounted with components.
[0009] Thus, the one-side X-rays transmission image and other-side X-rays transmission image
are obtained respectively through the above mentioned processes. Accordingly, the
one-side soldering condition and other-side soldering condition can be inspected from
the one-side X-rays transmission image and other-side X-rays transmission image respectively.
[0010] According to the method proposed in the above-mentioned Japanese Patent Laid Open
5-99643, an one-side X-rays transmission image is obtained and memorized beforehand.
And then, a both-side X-rays transmission image is obtained. Next, the one-side X-rays
transmission image and the both-side X-rays transmission image are aligned.
[0011] And the above mentioned one-side X-rays transmission image is subtracted from the
both-side X-rays transmission image at soldering portion which should be inspected.
Whereby, the one-side soldering portion and other-side soldering portion which should
be inspected can be inspected respectively.
[0012] As described above, according to prior methods, an other-side X-rays transmission
image is extracted by subtracting the one-side X-rays transmission image from the
both-side X-rays transmission image.
[0013] By the way, the number of components tends to increase and a mount density tends
to be enlarged since a demand of a compact product and so on. In such a high-density
surface mounted circuit board, a X-rays transmission image also becomes complicated.
[0014] Therefore, it is requested to obtain a highly accurate X-rays transmission image
corresponding to a real shape of the mounted surface in order to perform a soldering
inspection of a surface mounted circuit board certainly.
[0015] However, there is problem in the above mentioned prior methods. They can not obtain
any enough highly accurate X-rays transmission image to inspect soldering conditions
of the above-mentioned high-density surface mounted circuit board since an other-side
X-rays transmission image is extracted by just simple subtracting the one-side X-rays
transmission image from the both-side X-rays transmission image.
[0016] In view of the foregoing problems with the prior art techniques, the present invention
has been made. It is an object of the present invention to provide a method and an
apparatus for soldering inspection of a surface mounted circuit board, which can perform
a soldering inspection of a surface mounted circuit board and improve an inspection
accuracy to obtain a highly accurate X-rays transmission image corresponding to a
real shape of the mounted surface.
[0017] It is another object of the present invention to provide an image reader suitable
to set into the apparatus for soldering inspection of a surface mounted circuit board.
[0018] The inventors paid attention to a spatial frequency while considering to obtain a
highly accurate X-rays transmission image.
[0019] A response of a X-ray image intensifier to a spatial frequency is shown in Fig.9.
The X-ray image intensifier is one kind of the X-rays detectors. A response of a X-rays
detector to a spatial frequency varies with a variation of a spatial frequency as
understood from the Fig.9. In other words, the response to the spatial frequency is
not constant. This means X-rays transmission amounts concerning two states of a both-side
surface mounted circuit board are detected with variant response. The one state is
the state where one side surface of the both-side surfaces mounted circuit board has
been only mounted with components. Hereon, the other state is the state where both
side surfaces of the both-side surfaces mounted circuit board have been mounted with
components. Because the both-side surfaces mounted circuit board in the above one
state has a different spatial frequency from the both-side surfaces mounted circuit
board in the other state. For this reason, any enough highly accurate other-side X-rays
transmission image of the above-mentioned high-density surface mounted circuit board
to be inspected soldering conditions can not be obtained under an influence due to
a response characteristic of a X-ray detector.
[0020] In fact, any enough highly accurate other-side X-rays transmission image can not
be obtained by prior soldering inspection method wherein an other-side X-rays transmission
image is extracted by just simple subtracting an one-side X-rays transmission image
from a both-side X-rays transmission image.
[0021] Especially, gain characteristic of a X-rays detector falls down in a high spatial
frequency range due to communication characteristic of an image processing apparatus,
so that a response of the X-rays detector becomes worse. In other words, a relation
between a density information in a high spatial frequency range and a X-rays shield
degree of a radiated object differs with a relation between a density information
in a low spatial frequency range and a X-rays shield degree of a radiated object.
It is made difficult by the above difference to obtain the X-rays transmission images
corresponding to real figures of the mounted surfaces.
DISCLOSURE OF THE INVENTION
[0022] Thereat, in order to achieve the above-mentioned object, the present invention inspects
soldering conditions by such a method as follows applying a soldering inspection apparatus
comprising an one-side transmission image reader, an one-side soldering inspector,
a both-side transmission image reader, at least one response adjustor, a subtracter
and an other-side soldering inspector.
[0023] The present method for inspecting soldering conditions of a surface mounted circuit
board, which the present invention applies in order to achieve the above-mentioned
object, includes an one-side transmission image reading process for obtaining an one-side
transmission image to radiate X-rays to a circuit board of which only one side surface
is mounted with components, an one-side soldering inspection process for inspecting
soldering conditions using the one-side transmission image, a both-side transmission
image reading process for obtaining a both-side transmission image to radiate X-rays
to the circuit board of which both side surfaces are mounted with components, a response
adjustment process for adjusting responses of the one-side transmission image and
both-side transmission image so as to make their response characteristics into uniform
in a referred spatial frequency range on the basis of response characteristics to
a spatial frequency concerning an image radiographic system and an image processing
system at the reading processes, a subtraction process for subtracting the one-side
transmission image of which response adjusted from the both-side transmission-image
of which response adjusted in order to obtain an other-side transmission image, and
an other-side soldering inspection process for inspecting soldering conditions using
the other-side transmission image.
[0024] The response adjustment process may be performed by such as a process for making
gain characteristics of the one-side transmission image and both-side transmission
image into uniform in the referred spatial frequency range. According to the soldering
inspection method of this above-mentioned invention, the one-side transmission image
and both-side transmission image having different spatial frequencies respectively
are adjusted so as to make their response characteristics into uniform in the referred
spatial frequency range by the above-mentioned response adjustment.
[0025] Therefore, an influence from characteristic of a response which is not constant through
all the spatial frequencies in the X-ray detector (for example, gain characteristic
falls down in the high spatial frequency range) can be eliminated. A precise other-side
transmission image can be obtained by means of subtracting the adjusted one-side transmission
image from the adjusted both-side transmission image. Consequently, an accuracy of
a soldering inspection is improved.
[0026] In addition, a highly accurate inspection can be performed provided that the adjusted
one-side transmission image is applied at the one-side soldering inspection process.
[0027] Further, the foregoing subtraction process for subtracting the one-side transmission
image from the both-side transmission image includes an alignment process as follows.
[0028] At first, information concerning standard marks are read from the one-side transmission
image and the both-side transmission image respectively. Next, gap amounts between
information concerning reference points on the circuit board which have given in advance
and the above information concerning the standard marks are calculated respectively.
And then both one-side transmission image and the both-side transmission image are
aligned with an amendment for amending a slight gap between the foregoing transmission
images by using the above gap amounts.
[0029] At the above mentioned alignment process, gap amount between the one-side transmission
image and the both-side transmission image is under one picture element pitch. For
this reason, a more accurate other-side transmission image can be obtained in comparison
with a prior other-side transmission image which is obtained by means of only coinciding
information concerning the standard marks which have been respectively read from both
images.
[0030] Moreover, it is preferable for the one-side transmission image to be transferred
after compression and coding when the one-side transmission image is transferred toward
necessary processes for obtaining the other-side transmission image. Whereby a transferring
speed of the one-side transmission image is improved.
[0031] Further, it is preferable that such as processes for decoding, expanding and memorizing
the above compressed and coded one-side transmission image are provided. Whereby the
one-side transmission image can be taken out at any times while synchronizing the
both-side transmission image reading process. So that, the soldering inspections about
one and other side surfaces of the circuit board can be carried out at the same time.
In addition, while inspection about one circuit board is performed, an one-side transmission
image of a next one circuit board can be ready. It becomes possible to carry out soldering
inspection with synchronizing process for manufacturing surface mounted circuit boards.
[0032] In addition, the image reader which is suitable to be provided in apparatus for performing
the above mentioned soldering inspection method of the present invention, comprises
a recording means for recording a radiation transmission image of a flat circuit board
onto a recording plate which consists of a radiate-out phosphor material, wherein
the radiation transmission image is obtained by means of radiating a radiation perpendicularly
from a radiation source positioned above the circuit board towards the recording plate
below the circuit board,
a reading means for reading the foregoing recorded image on the recording plate, wherein
a reading operation is performed by catching a radiate-out luminous light which is
irradiated out from the recording plate by means of irradiating an excitation light
onto the recording plate,
an erasing means for erasing the foregoing recorded image on the recording plate,
wherein an erasing operation is performed by exposing the recording plate to light,
a circulation conveyance means for conveying the recording plate circularly within
a first horizontal plane, wherein the recording plate is conveyed circularly in order
of the recording means, the reading means, the erasing means and the recording means
again, and
a circuit board conveyance means for conveying the circuit board within a second horizontal
plane which is located upward in parallel with the first horizontal plane.
[0033] In the above mentioned image reader, a distance between the circulation conveyance
means and the circuit board conveyance means can be set into narrow since the recording
plate and the circuit board are conveyed within the horizontal planes which are in
parallel with each other. As a result of that, a whole size of the image reader becomes
compact. Moreover, it is rare for an operator to be bathed in a radiation since the
radiation is radiated downward (toward a floor) in the image recording section.
[0034] It is preferable for the recording plate to be conveyed within the first horizontal
plane circularly with sucked on the circulation conveyance means by a vacuum suction
device. Whereby, a removal and a installation of the recording plate onto the circulation
conveyance means can be done extremely simply. And also, a seting the recording plate
at a desired position in the circulation conveyance means can be done easily.
[0035] It is preferable for the recording means to have an elevator for adjusting a distance
between the circuit board and the recording plate in the image recording section.
Whereby, an image reading operation can be carried out whether object size is small
or large. And also, a focus can be easily adjusted.
[0036] It is preferable for the reading means to have a plurality of scanning devices along
the conveying direction. The scanning devices irradiate excitation lights on only
one recording plate, Whereby, different portions of the foregoing recording plate
can be scanned at the same time and the different portions of only one image can be
recorded at the same time. Accordingly, a scanning time becomes short with inversely
proportion to the number of scanning devices. Also, there is no problem of requiring
a lot of time in scanning.
[0037] Furthermore, it is preferable for the plurality of scanning devices to share light
beams from a common light source with each other. Whereby, an economical profitability
improves.
[0038] Also, it is preferable for the plurality of scanning devices to irradiate light beams
of which irradiation intensities are uniform. Whereby, a calibration of output ranges
between the plurality of scanning devices becomes unnecessary.
BRIEF DESCRIPTION OF THE DRAWINGS
[0039]
Fig.1 depicts a perspective view of an image reader as components in it can be seen,
which is provided in apparatus for executing a method for soldering inspection of
a surface mounted circuit board concerning one embodiment of the present invention;
Fig.2 is the figure for explaining a conception of scanning devices in the above image
reader;
Fig.3 depicts a perspective view of a vacuum suction device applied to the conveyance
means for conveying the recording plate or the circuit board in Fig. 1;
Fig.4 depicts the block diagram which shows construction of the soldering inspection
method concerning one embodiment of the present invention;
Fig.5 is a model figure for explaining a condition of alignment which aligns an one-side
transmission image and an both-side transmission image with amending a scant gap under
picture element pitch;
Fig.6 (a) shows an example of a both-side surfaces mounted circuit board;
Fig.6 (b) shows an example of a X-rays transmission amount distribution concerning
a both-side surfaces mounted circuit board;
Fig.7 (a) shows an example of an one-side surface mounted circuit board;
Fig.7 (b) shows an example of a X-rays transmission amount distribution concerning
an one-side surface mounted circuit board;
Fig.8 (a) shows an example of an other-side surface mounted circuit board;
Fig.8 (b) shows an example of a X-rays transmission amount distributions concerning
an other-side surface mounted circuit board as a model and a subtracted transmission
image which is obtained by subtracting the one-side transmission image from the both-side
transmission image;
Fig.9 shows one of examples concerning a response characteristics of X-rays detector.
BEST MODE FOR CARRYING OUT THE INVENTION
[0040] One embodiment which materializes the present invention will be explained referring
attached figures as follows. They will be offered in understanding of the present
invention. In addition, a technical scope of the present invention is not limited
by only the following embodiment. The following embodiment is just one of examples
which materialize the present invention.
[0041] First, image reader 23 for reading a radiation transmission image applying a radiation
such as a X-rays is explained based on the Fig.1, which is provided for the apparatus
to carry a soldering inspection method of a surface mounted circuit board concerning
this invention.
[0042] The image reader 23 shown in Fig.1 comprises structurally main elements as follows.
[0043] A X-rays generator 41.
[0044] A circulation conveyor, which is not shown in Fig.1, for conveying a radiate out
phosphor sheet loaded on a substrate 43 circularly within a first horizontal plane,
wherein the radiate out phosphor sheet is conveyed circularly in order of arrows Y1,
Y2, Y3, and Y4.
[0045] A circuit board conveyor 42 for conveying a printed circuit board P within a second
horizontal plane pointed out by an arrow X, which is located upward in parallel with
the first horizontal plane and which has been divided into an initial half 42a in
an image recording section and a last half 42b in other section.
[0046] An erasing means 48 having a fluorescent lamp in order to erase an information of
a recorded image on the radiate-out phosphor sheet conveyed into by the circulation
conveyor.
[0047] In addition, the circuit board conveyor 42 can lift up and down the circuit board
in the direction of arrow Z by motors M1 and M2 provided in the initial and last halves
42a, 42b respectively. Whereby, a focus can be easily adjusted in accordance with
a size of the circuit board.
[0048] The circuit board is conveyed under the X-rays generator 41 as shown in Fig.1 by
the initial half 42a of the circuit board conveyor 42. And the X-rays generator 41
radiates X-rays downward. The X-rays transmitted from the circuit board is further
radiated toward the radiate-out phosphor sheet S positioned under the circuit board.
An image corresponding to a figure of the whole of the circuit board and soldering
portions on its mounted surface is recorded on the radiate-out phosphor sheet S .
[0049] The radiate-out phosphor sheet S recording the image is conveyed into an image reader
section 45 as shown by arrow Y1. Details of the image reader section 45 is shown in
Fig.2.
[0050] In the image reader section 45, a laser beam shown by an arrow from a laser beam
oscillator 51 is deflected at a galvanometer 52 within a plane 54 crossing perpendicularly
with the paper on which Fig.2 is drawn. An aberration of the laser beam is canceled
through a fθ - lens 53. And then the laser beam comes up at a half reflection mirror
55.
[0051] Hereon, the fθ - lens 53 is a lens wherein an image height is proportional to an
incident angle (a scanning angle) θ so as to make a scanning velocity on a screen
into uniform. And also the fθ - lens 53 is designed so as to close to a function of

of which
f is a focal distance.
[0052] The half reflection mirror 55 is designed so as to make a transmission probability
into 50%.
[0053] A quantity of light concerning laser beam which is reflected at the half reflection
mirror 55 and comes up to a first perfect reflection mirror 56a is the same quantity
of light concerning laser beam which goes through the half reflection mirror 55 and
comes up to a third perfect reflection mirror 56c. The laser beam reflected by the
first perfect reflection mirror 56a is reflected by second perfect reflection mirror
56b toward the radiate-out phosphor sheet S loaded on the substrate 43. And, the laser
beam going through the half reflection mirror 55 is reflected by third perfect reflection
mirror 56c toward the radiate-out phosphor sheet S loaded on the substrate 43. Thus,
the laser beam is irradiated toward the radiate-out phosphor sheet S.
[0054] The laser beam from the second perfect reflection mirror 56b is irradiated toward
on a lower stream side of the radiate-out phosphor sheet S with respect to a conveyance
direction Y1. The laser beam from the third perfect reflection mirror 56c is irradiated
toward on a upper stream side of the radiate-out phosphor sheet S with respect to
the conveyance direction Y1. Both the laser beams are irradiated on the radiate-out
phosphor sheet S at the same time. This implies the same effect as two scanners are
arranged in the conveyance direction.
[0055] Further, the two scanners share a laser beam from one common light source. The two
scanners bring an effect of reducing a scanning time into half in comparison with
only one scanner scanning the radiate-out phosphor sheet S. Hereon, the scanning time
corresponds to a time for reading the image.
[0056] Moreover, an adjustment concerning the quantities of light is not necessary since
quantities of light concerning both laser beams are equal to each other.
[0057] The substrate 43 loaded with the radiate-out phosphor sheet S has a vacuum suction
device on its top surface in order to set and keep the radiate-out phosphor sheet
S on an appropriate position on its top surface certainly and also detach it from
its top surface easily. Details of the vacuum suction device is shown in the Fig.3.
An inside of substrate 43 is hollow. A plurality of suction bores 49 formed on the
top surface of the substrate 43 is communicable with an inside of a flexible tube
47 through the inside space of substrate 43. The flexible tube 47 is coupled with
a vacuum source 48. Therefore, the radiate-out phosphor sheet S shown by a two dash
line is set and kept to an appropriate position on the top surface of the substrate
43 certainly by means of setting the vacuum source 48 in operation after loading the
substrate 43 with the radiate-out phosphor sheet S.
[0058] And also, the radiate-out phosphor sheet S is allowed to detach from the substrate
43 by menas of stopping the operation of the vacuum source 48.
[0059] Visible fluorescent lights are irradiated from a territory which is made into an
excitation state on the radiate-out phosphor sheet S by 2 number of laser beams irradiated
toward the radiate-out phosphor sheet S.
[0060] A quantities of fluorescent light from referential positions are detected by 2 number
of light detectors 57 as divided data of time. The referential position is established
by a deflection (scan) angle at the galvanometer 52 and a conveyance quantity by a
belt 50 within the image reading section 45.
[0061] Two-dimensional images recorded on the radiate-out phosphor sheet S can be detected
as divided data of time, which corresponds to transmission quantity distribution of
the X-rays concerning the circuit board and the soldering portion of it. The radiate-out
phosphor sheet S on which the image has been read is conveyed in the direction of
arrow Y2 by the conveyor which is not illustrated. And the radiate-out phosphor sheet
S is exposed to a light of a fluorescent lump in the erasing means in order to erase
an information of the recorded image on the radiate-out phosphor sheet.
[0062] The radiate-out phosphor sheet S on which the information of the recorded image is
erased is further conveyed within the horizontal plane as shown by the arrows Y3 and
Y4 in Fig.1. At last, it returns under the X-rays generator 41 in the image recording
section again. Thus, the radiate-out phosphor sheet S is conveyed circularly in the
image reader 23. And, by repeating the above-mentioned processes, the radiate-out
phosphor sheet S can be used repeatedly without being discharged.
[0063] In the above-mentioned embodiment, the light beam scanners are applied to the reader
section for reading the image on the radiate-out phosphor sheet S.
[0064] Photoreceptor may be applied instead of the radiate-out phosphor sheet S. In this
case, two number of light beams having quantities of light in accordance with image
data respectively are irradiated toward the photoreceptor. Namely, it is possible
to apply as an image former (an image writer ).
[0065] By applying the above-mentioned image reader, following effects can be obtained.
A distance between the circulation conveyer and the circuit board conveyer can be
set into narrow since the radiate-out phosphor sheet S as the recording plate and
the circuit board are conveyed within the horizontal planes which are in parallel
with each other. As a result of that, a whole size of the image reader becomes compact.
Moreover, there is little danger of a radiation leakage since the radiation is radiated
toward a floor in the image recording section.
[0066] A image reading operation can be carried out whether object size is small or large
since the circuit board can be lifted up and down in the image recording section in
order to adjust the distance between the circuit board and the recording plate. And
also, a focus can be easily and certainly adjusted.
[0067] In case that the radiate-out phosphor sheet S as the recording plate can be conveyed
with sucked on the circulation conveyer by the vacuum suction device, a removal and
a installation of the radiate-out phosphor sheet S onto the circulation conveyer can
be done extremely simply. And also, there is few probability of the radiate-out phosphor
sheet S moving slightly from the desired position. A scanning time reduces in inverse
proportion to the number of the scanners since the plurality of scanners perform at
the same time for only one scanned object. The number of light sources are reduced
by a construction comprising the plurality of scanners which can be share a light
beam from a common light source. Accordingly, the economical image reader can be obtained.
And, it can become unnecessary to calibrate an output range of each scanner provided
that all irradiation intensities of light beams from the plurality of scanners are
same. Also, device for calibrating an output range of each scanner can become unnecessary.
Therefore, scanners can be simplified.
[0068] Secondly, a soldering inspection method of a surface mounted circuit board concerning
the present invention will be explained.
[0069] A soldering inspection apparatus 1 shown in Fig.4 concerning one of embodiments is
installed in a soldering inspection line which constitutes one part of a line for
mounting components on a surface of a circuit board so as to be able to carry a soldering
inspection successively after mounting components on the surface of the circuit board.
[0070] In case an inspected object is the circuit board which should be mounted with components
on both side surfaces of it, the soldering inspection apparatus 1 comprises following
means.
a first inspection section 2 for inspecting an one-side surface.
a second inspection section 3 for inspecting an other-side surface.
a transmission passage 4 connected to both first and second inspection sections for
transferring an image data from the first inspection section 2 to the second inspection
section 3.
[0071] The first inspection section 2 is stationed on a line for mounting components on
the one-side surface of the circuit board and the second inspection section 3 is stationed
on a line for mounting components on the other-side surface.
[0072] In case an inspected object is the circuit board which should be mounted with components
on only its one side surface, the soldering inspection apparatus 1 inspects the inspected
object at the first inspection section 2 only.
[0073] The first inspection section 2 for the one side surface includes a first image reader
23 for reading a X-rays transmission image, a first response adjustor 22, a first
judgment device 7 for judging a defect of a mounted state, an image compressor 24,
an image encoder 25, a first memory 5 and an image transmitter 6.
[0074] The second inspection section 3 for an other side surface includes an image receiver
8, an image decoder 9, an image expander 10, first and second switching devices 11
and 14, second and third memories 12 and 13, a second image reader 17 for reading
a X-rays transmission image, second and third response adjustors 15 and 18, a subtracter
20, first and second standard mark calculators 16 and 19 and a second judgment device
for judging a defect of a mounted state 21.
[0075] The first and second image readers 23 and 17 can judge figures of soldering portions
and amounts of soldering by means of detecting a distribution concerning amounts of
X-rays transmission at soldering portions of an inspected object from a X-rays transmission
image as shown in Fig.1. Whereby, we can inspect whether soldering conditions are
good or bad.
[0076] A soldering inspection method for inspecting soldering conditions of a surface mounted
circuit board concerning the present invention is performed by the above mentioned
soldering inspection apparatus as follows..
[0077] In a X-rays transmission image obtained by the above X-rays transmission image reader
23, a gain characteristic in a high range spatial frequency falls down under an influence
of a response characteristic. Accordingly, there is a problem wherein the X-rays transmission
images corresponding to real figures of mounted surfaces are not obtained precisely.
Therefore, gain characteristics of the transmission images are made into uniform in
a referred spatial frequency range by means of adjusting responses of the transmission
images on the basis of their response characteristics by the response adjustor 22.
The above mentioned soldering inspection process of inspecting soldering condition
from the distribution concerning amount of X-rays transmission is performed by the
first judgment device 7 with applying the response adjusted transmission image.
[0078] Thus, the circuit board mounted with components on its one side surface undergoes
a soldering inspection by devices such as the image reader 23, the response adjustor
22 and the first judgment device 7.
[0079] In case of the circuit board to be mounted on its one side surface only, the soldering
inspection has been finished by this time. In case of the circuit board to be mounted
on its both side surfaces, while the above mentioned soldering inspection for the
one side surface, the one-side transmission image obtained by the first image reader
23 is compressed and coded by the image compressor 24 and the image encoder 25, and
further is memorized into the first memory 5. And then, the memorized image is transferred
from the first inspection section 2 to the second inspection section 3 through the
transmission passage 4.
[0080] In the second inspection section 3, the transferred image is received, decoded and
expanded by the image receiver 8, the image decoder 9 and the image expander 10. Whereby,
the one-side transmission image is regenerate. The one-side transmission image is
memorized into the second or third memory 12 or 13 properly selected by the first
switching device 11.
[0081] Accordingly, transferring time of transferring the one-side transmission image is
shortened since the transferred image is compressed and coded. The one-side transmission
image can be transferred to the second inspection section 3 during executing processes
for mounting components on an other side surface of the circuit board. Therefore,
the processes for mounting components on surfaces of the circuit board and the processes
of soldering inspection can be performed successively as one line.
[0082] The plurality of memories such as second and third memories store the one-side transmission
image transferred from the first inspection section 2 in order of transferring, and
further enable the one-side transmission images to be taken out and treated in accordance
with a flow of the processes for mounting components on surfaces of the circuit board.
And also, the plurality of memories enable an one-side transmission image of a next
circuit board to be ready and stored during extracting an other-side transmission
image of the present circuit board.
[0083] A both-side transmission image of the circuit board finished being mounted on its
both side surfaces is obtained by the image reader 17 in the second inspection section
3. And the both-side transmission image is adjusted by the third response adjustment
devices 18 so as to gain characteristic of the both-side transmission image is made
into uniform in the referred spatial frequency range. The adjusted both-side transmission
image is input into both the subtracter 20 and the second standard mark calculator
19.
[0084] The one-side transmission image of the circuit board is taken out from either second
or third memory 12 or 13 selected by the second switching device 14 and further adjusted
by the second response adjustor 15 as above while the both-side transmission image
of the circuit board is obtained as above. The adjusted one-side transmission image
is input into both the subtracter 20 and the first standard mark calculator 16.
[0085] In the first and second standard mark calculators 16 and 19, position information
concerning standard marks are read from the one-side transmission image and the both-side
transmission image respectively. And, gap amounts between information concerning reference
points on the circuit board which have given in advance and the above information
concerning the standard marks are calculated respectively there. And then, the gap
amounts are input from the first and second standard mark calculators 16, 19, into
the subtracter 20 respectively.
[0086] In the subtracter 20, an amendment calculation is performed in order to amend a slight
gap under one picture element pitch between the foregoing transmission images by using
the above gap amounts, and the adjusted one-side transmission image and the adjusted
both-side transmission image are aligned.
[0087] And then, an other-side transmission image is obtained by subtracting the adjusted
one-side transmission image from the adjusted both-side transmission image. A soldering
inspection of the other-side surface is performed by the second judgment device 21
applying the above other-side transmission image.
[0088] The above mentioned alignment enables gap amount between one-side transmission image
and both-side transmission image to be under one picture element pitch when the other-side
transmission image is obtained by subtracting the adjusted one-side transmission image
from the adjusted both-side transmission image. The X-rays transmission image is made
as analog signal detected by X-rays detector and so on, and further is discreted every
referred times by an A/D converter. This referred time corresponds to one picture
element pitch of an image. Accordingly, if the subtraction for obtaining the other-side
transmission image is performed without the alignment of which error is under one
picture element pitch, an obtained image will have an error over one picture element
pitch.
[0089] This is one of factors which cause a mistake on the judgement of the soldering-inspection.
Therefore, in this embodiment of the present invention, the above factor of causing
the mistake on the judgement is eliminated by means of a two-dimensional amendment
concerning a shade level (X-rays transmission quantity level) of one picture element
at a required position.
[0090] For example, there is a two-dimensional matrix Ya

j , k

which shows a shade level of an image. Hereon,
j is a natural number which can change in a range from 1 to
m, and
k is a natural number which can change in a range from 1 to
n. Further, there are a Vector x1a having
m number of elements and a
[0091] Vector y1a having
n number of elements. A value of a shade level can be shown by the matrix and vectors
as follows.

Hereon, Ya is a value of the shade level discreted within one plane.
y is an analog value of the shade level.
[0092] An analog value of the shade level
y which we would like reason by analogy by means of the amendment is a value on a spot
(x1, x2) which is not included in points (x1a[j], x2a[k]). Now, we will think about
4 points which surrounds the spot (x1, x2) as shown in Fig. 5. Square surrounding
each point in Fig. 5 shows an element.
j and
k are defined as follows.

[0093] A shade level on each point is defined as follows.

[0094] The simplest two-dimensional amendment is performed as follows.

[0095] Accordingly, the shade level on the spot (x1,x2) is as follows.

[0096] The foregoing expression (10) implies putting a weight to a shade level on the required
position in accordance with an area ratio of a plurality of picture elements occupied
by the spot (x1,x2) and summing them.
[0097] Furthermore, in case of making an improved accuracy on the amendment, it is preferable
that m× n blocks including the spot (x1,x2) are selected, an one-dimensional amendment
is performed with
m number of the picture elements in a direction of x2 and an one-dimensional amendment
is performed with
n number of the picture elements in a direction of x1. A polynomial such as a formula
of Lagrange and so on, a rational function and a spline function can be used in one
dimension amendment.
[0098] The one-side transmission image and the both-side transmission image to be input
into the subtracter 20 are the transmission images of which responses have been adjusted
as already described. The above-mentioned adjustment of response is performed as follows.
[0099] The analog signal concerning a X-rays transmission image detected by the X-ray detector
is converted into digital data. Components of spatial frequency are extracted from
these digital images. The components of spatial frequency are multiplied by an adjustment
factors for making response characteristic nearly uniform within a referred spatial
frequency range fixed in advance. And then, the transmission image is adjusted by
inverse transforming multiplication results so as to make the response characteristic
into uniform within the referred spatial frequency range. The above-mentioned adjustment
factor is obtained as follows. Digital images are collected from various kind of objects
which have natural spatial frequencies respectively. The adjustment factors are fixed
so as to make a response into uniform through all spatial frequencies of the collected
images. The above-mentioned referred spatial frequency range implies, for example,
a range to which both spatial frequencies of the one-side transmission image and the
both-side transmission image belong.
[0100] An other-side transmission image having fine accuracy can be obtained by means of
extracting a subtracted image applying the above mentioned adjusted one-side transmission
image and both-side transmission image of which response characteristics are adjusted
so as to be nearly uniformed in the referred spatial frequency range as above mention.
[0101] The concrete example which extracts the subtracted image (i.e. the other-side transmission
image) applying the above mentioned adjusted one-side transmission image and both-side
transmission image will be shown below.
[0102] A chip component 27 is fixed by soldering at solder lands 28a formed on an one-side
surface 26a of a circuit board 35 as shown in Fig.6(a). A lead 33 of another component
is fixed by soldering on an other-side surface 26b of the circuit board 35 as shown
in Fig.6(a). Their transmission images could overlap each other. A shade level is
shown in Fig. 6(b), which shows X-rays transmission amount distributions concerning
the above mentioned circuit board 35 of which both side surfaces are mounted with
components. The circuit board 35 is shown in Fig.7(a), of which one side surface is
only mounted with components before the above mentioned circuit board 35 of which
both side surfaces are mounted with components. A shade level is shown in Fig. 7(b),
which shows X-rays transmission amount distributions concerning the circuit board
35 shown in Fig.7(a). A shade level is shown in Fig. 8(b), which shows differences
between the above mentioned X-rays transmission amount distributions shown in Fig.6(b)
and Fig.7(b).
[0103] There are two kind of X-rays transmission amount distributions shown in Fig.6(b),
Fig.7(b) and Fig.8(b) respectively. The first X-rays transmission amount distribution
is the distribution in the case of non-applying adjustment concerning response of
transmission image. The second X-rays transmission amount distribution is the distribution
in the case of applying adjustment concerning response of transmission image.
[0104] Further, the third X-rays transmission amount distribution is added in Fig.8(b).
The third X-rays transmission amount distribution is the distribution concerning another
circuit board as a comparative example for supposing the above mentioned circuit board
35 of which other side surface is only mounted with components, and which is the distribution
in the case of applying adjustment concerning response of transmission image.
[0105] The transmission image concerning the above mentioned circuit board 35 of which other
side surface is only mounted with components can not obtained indeed. Therefore, the
third X-rays transmission amount distribution is offered as a ideal model in order
to verify how much the subtracted image applying the response adjustment closes to
the other-side transmission image concerning the circuit board 35 of which other side
surface is only mounted with components. It can be found that the subtracted image
after adjusting responses shown in Fig.8(b) approximates to the transmission image
concerning the ideal model mounted on only other side surface.
[0106] According to these examples, the average is 3.8% and the maximum is 12.1% concerning
the difference between the subtracted image without adjusting responses and the transmission
image of the ideal model. In case of adjusting responses, the average reduces into
1.2% and the maximum reduces into 4.0%. By adjusting responses as above mention, the
other-side transmission image can be extracted with high accuracy from the both-side
transmission image. And the effect in which the soldering inspection becomes accurate
will be obtained as a result. Moreover, the one-side transmission image and the both-side
transmission image can be inspected with same inspection standards since response
characteristics of both images are identified.
[0107] This invention as above mentioned has the following effects.
[0108] Even though the one-side transmission image and the both-side transmission image
have different spatial frequencies respectively, the other-side transmission image
having fine accuracy can be extracted by means of the adjustment which makes response
characteristics concerning spatial frequency into uniform in the referred spatial
frequency range. As a result, the inspection accuracy can be improved.
[0109] Moreover, the other-side transmission image having finer accuracy can be extracted
by means of alignment applying amendment of amending the gap between the one-side
transmission image and the both-side transmission image to calculate the gap amount
under one picture element pitch when the subtracted image is made by subtracting the
one-side transmission image from the both-side transmission image.
[0110] And the transfer speed is improved by means of proper transferring of the-compressed
and coded one-side transmission image to necessary processes for extracting the other-side
transmission image.
[0111] And also, the present invention has a construction as follows. The transferred one-side
transmission image is memorized by the plurality of image memories in order of the
transformation and taken out properly from them in accordance with processes for extracting
the other-side transmission image in order to be subtracted from the both-side transmission
image.
[0112] Because of the above construction, this invention has the further following effects.
[0113] The one-side transmission image and the other-side transmission image can undergo
soldering inspections at the same time. Also, the surface mounted circuit board can
undergo soldering inspection in accordance with a flow of manufacturing processes
of the surface mounted circuit board since an one-side transmission image of a next
circuit board can be ready during the inspection of the present circuit board.
INDUSTRIAL APPLICABILITY
[0114] The present invention is suitable for a method and an apparatus for soldering inspection
of a surface mounted circuit board, which improves an inspection accuracy by means
of obtaining a highly accurate X-rays transmission image corresponding to a real shape
of the mounted surface.
1. A method for soldering inspection of a surface mounted circuit board, including
an one-side transmission image reading process (23) for obtaining an one-side transmission
image to radiate X-rays to a circuit board of which only one side surface is mounted
with components,
an one-side soldering inspection process (22,7) for inspecting soldering conditions
using said one-side transmission image,
a both-side transmission image reading process (17) for obtaining a both-side transmission
image to radiate X-rays to said circuit board of which both side surfaces are mounted
with components,
a response adjustment process (15,18) for adjusting responses of said one-side transmission
image and both-side transmission image so as to make their response characteristics
into uniform in a referred spatial frequency range on the basis of response characteristics
to a spatial frequency concerning an image radiographic system and an image processing
system at said reading processes,
a subtraction process (19,16,20) for subtracting said one-side transmission image
of which response adjusted from said both-side transmission image of which response
adjusted in order to obtain an other-side transmission image, and
an other-side soldering inspection process (21) for inspecting soldering conditions
using said other-side transmission image.
2. A method for soldering inspection of a surface mounted circuit board according to
claim 1, wherein said one-side transmission image and said both-side transmission
image is adjusted so as to make gain characteristics of them into uniform in said
referred spatial frequency range at said response adjustment process.
3. A method for soldering inspection of a surface mounted circuit board according to
claim 1, wherein said subtraction process (19,16,20) for subtracting said one-side
transmission image from said both-side transmission image includes an alignment process
wherein
information concerning standard marks are read from said one-side transmission image
and said both-side transmission image respectively,
gap amounts between information concerning reference points on said circuit board
which have given in advance and said information concerning said standard marks are
calculated respectively,
a gap between said one-side transmission image and said both-side transmission image
is calculated using said gap amounts, which is under one picture element pitch and
both one-side transmission image and said both-side transmission image are aligned.
4. A method for soldering inspection of a surface mounted circuit board according to
claim 1, further including one process (24,25,6) wherein
said one-side transmission image is compressed, coded and transferred properly toward
necessary processes for obtaining said other-side transmission image.
5. A method for soldering inspection of a surface mounted circuit board according to
claim 4, further including another process (9,10,12,13) wherein said compressed and
coded one-side transmission image is decoded, expanded and memorized.
6. A method for soldering inspection of a surface mounted circuit board, including
an one-side transmission image reading process (23) for obtaining an one-side transmission
image to radiate X-rays to a circuit board of which only one side surface is mounted
with components,
a both-side transmission image reading process (17) for obtaining a both-side transmission
image to radiate X-rays to said circuit board of which both side surfaces are mounted
with components,
a subtraction process (19,16,20) for subtracting said one-side transmission image
from said both-side transmission image in order to obtain an other-side transmission
image and
an other-side soldering inspection process (21) for inspecting soldering conditions
using said other-side transmission image, wherein
said subtraction process (19,16,20) includes an alignment process wherein
information concerning standard marks are read from said one-side transmission image
and said both-side transmission image respectively,
gap amounts between information concerning reference points on said circuit board
which have given in advance and said information concerning said standard marks are
calculated respectively,
a gap between said one-side transmission image and said both-side transmission image
is calculated using said gap amounts, which is under one picture element pitch and
both one-side transmission image and said both-side transmission image are aligned,
7. A method for inspecting soldering conditions from a transmission image applying radiating
X-rays, including
a response adjustment process wherein a response of said transmission image is adjusted
so as to make its response characteristic into uniform in a referred spatial frequency
range on the basis of a response characteristic to a spatial frequency concerning
an image radiographic system and an image processing system at the time of reading
the transmission image and
a soldering inspection process for inspecting soldering conditions using said transmission
image of which response is adjusted.
8. An apparatus for soldering inspection of a surface mounted circuit board, comprising
an one-side transmission image reading means (23) for obtaining an one-side transmission
image to radiate X-rays toward a circuit board of which only one side surface is mounted
with components,
an one-side soldering inspection means (22,7) for inspecting soldering conditions
using said one-side transmission image,
a both-side transmission image reading means (17) for obtaining a both-side transmission
image to radiate X-rays to said circuit board of which both side surfaces are mounted
with components,
a response adjustment means (15,18) for adjusting responses of said one-side transmission
image and both-side transmission image so as to make their response characteristics
into uniform in a referred spatial frequency range on the basis of response characteristics
to a spatial frequency concerning an image radiographic system and an image processing
system in said reading means,
a subtraction means (19,16,20) for subtracting said one-side transmission image of
which response adjusted from said both-side transmission image of which response adjusted
in order to obtain an other-side transmission image, and
an other-side soldering inspection means (21) for inspecting soldering conditions
using said other-side transmission image.
9. An apparatus for soldering inspection of a surface mounted circuit board according
to claim 8, wherein said one-side transmission image and said both-side transmission
image is adjusted by said response adjustment means so as to make gain characteristics
of them into uniform in said referred spatial frequency range.
10. An apparatus for soldering inspection of a surface mounted circuit board according
to claim 8, wherein said subtraction means (19,16,20) for subtracting said one-side
transmission image from said both-side transmission image includes an alignment means
wherein
information concerning standard marks are read from said one-side transmission image
and said both-side transmission image respectively,
gap amounts between information concerning reference points on said circuit board
which have given in advance and said information concerning said standard marks are
calculated respectively,
a gap between said one-side transmission image and said both-side transmission image
is calculated using said gap amounts, which is under one picture element pitch and
both one-side transmission image and said both-side transmission image are aligned.
11. An apparatus for soldering inspection of a surface mounted circuit board according
to claim 8, further including one means (24,25,6) wherein
said one-side transmission image is compressed, coded and transferred properly toward
necessary means for obtaining said other-side transmission image.
12. An apparatus for soldering inspection of a surface mounted circuit board according
to claim 11, further including another means (9, 10, 12,13) wherein said compressed
and coded one-side transmission image is decoded, expanded and memorized.
13. An apparatus for soldering inspection of a surface mounted circuit board, comprising
an one-side transmission image reading means (23) for obtaining an one-side transmission
image to radiate X-rays to a circuit board of which only one side surface is mounted
with components,
a both-side transmission image reading means (17) for obtaining a both-side transmission
image to radiate X-rays to said circuit board of which both side surfaces are mounted
with components,
a subtraction means (19,16,20) for subtracting said one-side transmission image from
said both-side transmission image in order to obtain an other-side transmission image
and
an other-side soldering inspection means (21) for inspecting soldering conditions
using said other-side transmission image, wherein
said subtraction means (19,16,20) includes an alignment means wherein
information concerning standard marks are read from said one-side transmission image
and said both-side transmission image respectively,
gap amounts between information concerning reference points on said circuit board
which have given in advance and said information concerning said standard marks are
calculated respectively,
a gap between said one-side transmission image and said both-side transmission image
is calculated using said gap amounts, which is under one picture element pitch and
both one-side transmission image and said both-side transmission image are aligned,
14. An apparatus for inspecting soldering conditions from a transmission image applying
radiating X-rays, comprising
a response adjustment means wherein a response of said transmission image is adjusted
so as to make its response characteristic into uniform in a referred spatial frequency
range on the basis of a response characteristic to a spatial frequency concerning
an image radiographic system and an image processing system at the time of reading
the transmission image and
a soldering inspection means for inspecting soldering conditions using said transmission
image of which response is adjusted.
15. An image reader comprising
a recording means (41,S) for recording a radiation transmission image of a flat circuit
board (P) onto a recording plate (s) which consists of a radiate-out phosphor material,
wherein said radiation transmission image is obtained by means of radiating a radiation
perpendicularly from a radiation source (41) positioned above said circuit board towards
said recording plate below said circuit board,
a reading means (45) for reading said recorded image on said recording plate (S),
wherein a reading operation is performed by catching a radiate-out luminous light
which is irradiated out from said recording plate (S) by means of irradiating an excitation
light onto said recording plate,
an erasing means (46) for erasing said recorded image on said recording plate (S),
wherein an erasing operation is performed by exposing said recording plate (S) to
light,
a circulation conveyance means (43) for conveying said recording plate (S) circularly
within a first horizontal plane (Y1,Y2,Y3,Y4), wherein said recording plate (S) is
conveyed circularly in order of said recording means (41,S), said reading means (45),
said erasing means(46) and said recording means (41,S) again, and
a circuit board conveyance means (42) for conveying said circuit board (P) within
a second horizontal plane which is located upward in parallel with said first horizontal
plane (Y1,Y2,Y3,Y4).
16. An image reader according to claim 15, wherein said recording plate (S) is conveyed
within said first horizontal plane (Y1,Y2,Y3,Y4) circularly with sucked by a vacuum
suction device.
17. An image reader according to claim 15, wherein said recording means (41,S) has a lifting
device for adjusting a distance between said circuit board (P) and said recording
plate (S).
18. An image reader according to claim 15, wherein said reading means (45) has a plurality
of scanning devices (51-57) along said conveying direction (Y1) and the scanning devices
irradiate excitation lights on one recording plate (S).
19. An image reader according to claim 18, wherein said plurality of scanning devices
(51-57) share light beams from a common light source (51) with each other.
20. An image reader according to claim 18, wherein said plurality of scanning devices
irradiate light beams of which irradiation intensities are uniform.