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(11) | EP 0 780 719 A3 |
(12) | EUROPEAN PATENT APPLICATION |
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(54) | Method for repairing a low noise address line for thin film imager devices |
(57) A method of repairing an open circuit defect in a damaged address line in a thin
film electronic imager array is provided that includes the steps of forming a repair
area (145) exposing the open circuit defect and portions of the damaged address line
(120) adjoining the defect, with a first protective layer (150) disposed over the
array surrounding the repair area; depositing a layer of conductive repair material
(160) over the array so that a portion of the conductive repair material is disposed
in the repair area to form a repair shunt (165) electrically connecting the portions
of the address line (120) adjoining the defect; forming a planarized second protective
layer (170) over the array; removing portions of the second protective layer (170)
to form a planarized surface on the array on which the conductive repair material
(160) is exposed except for the repair shunt (165) underlying a plug portion of the
second protective layer disposed over the repair area; removing the conductive repair
material (160) from the array surface except for the portion underlying the plug portion
of the second protective layer; and removing remaining portions of the first protective
layer (150) and the second protective layer plug portion from the repair area (145). |