X-RAY SPECTROMETER COMPRISING A PLURALITY OF FIXED MEASURING CHANNELS - Patent 0805967

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EP 0 805 967 A1

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(43)	Date of publication:
	12.11.1997 Bulletin 1997/46

(21)	Application number: 96922175.0

(22)	Date of filing: 17.07.1996

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International Patent Classification (IPC):

G01N 23/ 223^{( . )}
G21K 1/ 06^{( . )}

G01N 23/ 207^{( . )}

(86)	International application number:
	PCT/IB1996/000717

(87)	International publication number:
	WO 1997/005474 (13.02.1997 Gazette 1997/08)

(84)	Designated Contracting States:
	CH DE FR GB LI NL

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Priority:

25.07.1995 EP 19950202048

(71)	Applicant: Philips Electronics N.V.
	5621 BA Eindhoven (NL)

(72)	Inventors:
	VAN EGERAAT, Walterus, Alphonsus, L. A. NL-7609 CA Almelo (NL) BRINKER, Robertus, Jacobus, Maria NL-7602 EA Almelo (NL)

(74)	Representative: Bakker, Hendrik, et al
	INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6 5656 AA Eindhoven 5656 AA Eindhoven (NL)

(54)	X-RAY SPECTROMETER COMPRISING A PLURALITY OF FIXED MEASURING CHANNELS