<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE ep-patent-document PUBLIC "-//EPO//EP PATENT DOCUMENT 1.4//EN" "ep-patent-document-v1-4.dtd"><ep-patent-document id="EP0888570A1" file="EP97952867NWA1.xml" lang="de" doc-number="0888570" date-publ="19990107" kind="A1" country="EP" status="n" dtd-version="ep-patent-document-v1-4"><SDOBI lang="de"><B000><eptags><B001EP>......DE....FRGB..IT....NL..........................................................................</B001EP><B003EP>*</B003EP><B007EP>EPregister to ST.36 EBD process v 1.0 kbaumeister@epo.org (15 Jan 2013)</B007EP></eptags></B000><B100><B110>0888570</B110><B130>A1</B130><B140><date>19990107</date></B140><B190>EP</B190></B100><B200><B210>97952867.0</B210><B220><date>19971203</date></B220><B240><B241><date>19980720</date></B241></B240><B250>de</B250><B251EP>de</B251EP><B260>de</B260></B200><B300><B310>19961053983</B310><B320><date>19961221</date></B320><B330><ctry>DE</ctry></B330></B300><B400><B405><date>19990107</date><bnum>199901</bnum></B405><B430><date>19990107</date><bnum>199901</bnum></B430></B400><B500><B510EP><classification-ipcr sequence="1"><text>H01L  21/   027            A I                    </text></classification-ipcr><classification-ipcr sequence="2"><text>G02B  13/    14            A I                    </text></classification-ipcr><classification-ipcr sequence="3"><text>G02B  13/    18            A I                    </text></classification-ipcr><classification-ipcr sequence="4"><text>G02B  13/    22            A I                    </text></classification-ipcr><classification-ipcr sequence="5"><text>G02B  13/    24            A I                    </text></classification-ipcr><classification-ipcr sequence="6"><text>G03F   7/    20            A I                    </text></classification-ipcr></B510EP><B540><B541>en</B541><B542>RETICULAR OBJECTIVE FOR MICROLITHOGRAPHY-PROJECTION EXPOSURE INSTALLATIONS</B542><B541>fr</B541><B542>OBJECTIF A RETICULE POUR UNITES D'EXPOSITION PAR PROJECTION POUR MICROLITHOGRAPHIE</B542><B541>de</B541><B542>REMA-OBJEKTIV FÜR MIKROLITHOGRAPHIE-PROJEKTIONSBELICHTUNGSANLAGEN</B542></B540></B500><B700><B710><B711><snm>Carl Zeiss</snm><adr><str /><city>D-89518 Heidenheim (Brenz)</city><ctry>DE</ctry></adr></B711><B711><snm>CARL-ZEISS-STIFTUNG, trading as CARL ZEISS</snm><adr><str /><city>89518 Heidenheim</city><ctry>DE</ctry></adr></B711></B710><B720><B721><snm>SCHULTZ, Jörg</snm><adr><str>Bohlstrasse 29</str><city>D-73430 Aalen</city><ctry>DE</ctry></adr></B721><B721><snm>WANGLER, Johannes</snm><adr><str>An der Reute 15</str><city>D-89551 Königsbronn</city><ctry>DE</ctry></adr></B721><B721><snm>SCHUSTER, Karl-Heinz</snm><adr><str>Rechbergstrasse 24</str><city>D-89551 Königsbronn</city><ctry>DE</ctry></adr></B721></B720><B740><B741><snm>Müller-Rissmann, Werner Albrecht, Dr., et al</snm><adr><str>Carl Zeiss, Patentabteilung</str><city>73446 Oberkochen</city><ctry>DE</ctry></adr></B741></B740></B700><B800><B840><ctry>DE</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>IT</ctry><ctry>NL</ctry></B840><B860><B861><dnum><anum>EP1997006760</anum></dnum><date>19971203</date></B861><B862>de</B862></B860><B870><B871><dnum><pnum>WO1998028644</pnum></dnum><date>19980702</date><bnum>199826</bnum></B871></B870></B800></SDOBI></ep-patent-document>