(19)
(11) EP 0 952 470 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
14.01.2004 Bulletin 2004/03

(43) Date of publication A2:
27.10.1999 Bulletin 1999/43

(21) Application number: 99107362.8

(22) Date of filing: 22.04.1999
(51) International Patent Classification (IPC)7G02B 6/132, H01S 3/25, H01S 3/025, G02B 6/12
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 23.04.1998 JP 11305198

(71) Applicant: NEC CORPORATION
Tokyo (JP)

(72) Inventor:
  • Kudo, Koji
    Tokyo (JP)

(74) Representative: VOSSIUS & PARTNER 
Siebertstrasse 4
81675 München
81675 München (DE)

   


(54) A method of manufacturing a semiconductor optical waveguide array and an array-structured semiconductor optical device


(57) In a method of manufacturing a semiconductor optical waveguide array in an ultra-high integration, the device yield per wafer is considerably increased and uniform and improved characteristics are obtained. In this method, there is manufactured a semiconductor optical waveguide array including a plurality of optical waveguides in an array structure in stripe-shaped growth regions enclosed by dielectric thin films on a substrate. The waveguides are fabricated through a selective crystal growth process and include a semiconductor multilayer structure including a quantum well layer or a semiconductor multilayer structure including a bulk layer. Namely, there is formed a plurality of stripe-shaped growth regions elongated parallel to each other, the regions being enclosed with a dielectric thin film. In each growth region, a semiconductor multilayer structure is selectively grown by metallo-organic vapor phase epitaxy (MOVPE). In the selective growth, the growth regions are parallel to each other with an interval therebetween, the interval being less than a diffusion length of a source material in a reactive tube during the crystal growth. Assuming that the dielectric thin film arranged between the respective growth regions has a width Wa and a first outer-most dielectric thin film and a second outer-most dielectric thin film arranged respectively outside of outer-most ones of the growth regions respectively have widths Wm1 and Wm2, there is satisfied a relationship of Wm1 > Wa and Wm2 > Wa.







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