(19)
(11) EP 0 958 596 A1

(12)

(43) Date of publication:
24.11.1999 Bulletin 1999/47

(21) Application number: 97933371.0

(22) Date of filing: 10.07.1997
(51) International Patent Classification (IPC): 
H01L 21/ 28( . )
H01L 21/ 8238( . )
H01L 29/ 78( . )
H01L 21/ 225( . )
H01L 27/ 092( . )
(86) International application number:
PCT/US1997/012052
(87) International publication number:
WO 1998/013861 (02.04.1998 Gazette 1998/13)
(84) Designated Contracting States:
DE IE

(30) Priority: 24.09.1996 US 19960716772

(71) Applicant: INTEL CORPORATION
Santa Clara, CA 95052 (US)

(72) Inventor:
  • ANDIDEH, Ebrahim
    Portland, OR 97229 (US)

(74) Representative: Molyneaux, Martyn William, et al 
Langner Parry 52-54 High Holborn
London WC1V 6RR
London WC1V 6RR (GB)

   


(54) SCREENING OXIDE FOR SOURCE AND DRAIN REGIONS FORMED FROM SOLID DOPANT SOURCE