A METHOD FOR ELEMENT-SELECTIVE DETECTION, A MICRO PLASMA MASS SPECTROMETER FOR USE IN THE METHOD AND A PLASMA ION SOURCE, TOGETHER WITH APPLICATIONS THEREOF - Patent 0960431

(19)

(11)

EP 0 960 431 A1

(12)

(43)	Date of publication:
	01.12.1999 Bulletin 1999/48

(21)	Application number: 98904444.0

(22)	Date of filing: 12.02.1998

(51)

International Patent Classification (IPC):

G01N 27/ 62^{( . )}

H01J 49/ 10^{( . )}

(86)	International application number:
	PCT/NO1998/000048

(87)	International publication number:
	WO 1998/036440 (20.08.1998 Gazette 1998/33)

(84)	Designated Contracting States:
	DE FR GB IT NL

(30)

Priority:

14.02.1997 NO 19970000707

(71)	Applicants:
	Brede, Cato 0452 Oslo (NO) Pedersen-Bjergaard, Stig 0491 Oslo (NO) Greibrokk, Tyge 1342 jar (NO) Lundanes, Elsa 1165 Oslo (NO)

(72)	Inventors:
	Brede, Cato 0452 Oslo (NO) Pedersen-Bjergaard, Stig 0491 Oslo (NO) Greibrokk, Tyge 1342 jar (NO) Lundanes, Elsa 1165 Oslo (NO)

(74)	Representative: Baverstock, Michael George Douglas, et al
	BOULT WADE TENNANT, 27 Furnival Street London EC4A 1PQ London EC4A 1PQ (GB)

(54)	A METHOD FOR ELEMENT-SELECTIVE DETECTION, A MICRO PLASMA MASS SPECTROMETER FOR USE IN THE METHOD AND A PLASMA ION SOURCE, TOGETHER WITH APPLICATIONS THEREOF