Apparatus and method for inline testing of electrical components

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(11)

EP 1 111 398 A3

(12)	EUROPEAN PATENT APPLICATION

(88)	Date of publication A3:
	10.09.2003 Bulletin 2003/37

(43)	Date of publication A2:
	27.06.2001 Bulletin 2001/26

(21)	Application number: 00125233.7

(22)	Date of filing: 22.11.2000

(51)	International Patent Classification (IPC)⁷: G01R 31/316

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
	Designated Extension States:
	AL LT LV MK RO SI

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Priority:

22.12.1999 US 470714

(71)	Applicant: TRW INC.
	Lyndhurst Ohio 44124 (US)

(72)	Inventors:
	Mailloux, James J. Terra Haute, Indiana 47803 (US) Marts, Brian S. Marshall, Illinois 62441 (US)

(74)	Representative: Wagner, Karl H., Dipl.-Ing. et al
	WAGNER & GEYER Patentanwälte Gewürzmühlstrasse 5 80538 München 80538 München (DE)

(54)	Apparatus and method for inline testing of electrical components

(57) An apparatus (10) for inline testing of a product (15) includes an environmental chamber (20), a conveyor (40), a stimulation means (60), and a monitoring means (80). The environmental chamber (20) provides thermal shock to the product (15) and includes a hot zone (22) and a cold zone (24). The conveyor (40) transports the product (15) through the hot (22) and cold zones (24) of the environmental chamber (20). The stimulation means (60) provides continuous electric stimulation to the product (15) during transport of the product (15) through the environmental chamber (20). The monitoring means (80) continuously monitors the effect of the stimulation means (60) on the product (15) during transport of the product (15) through the environmental chamber (20).

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