(19)
(11) EP 1 112 577 A1

(12)

(43) Date of publication:
04.07.2001 Bulletin 2001/27

(21) Application number: 00937104.8

(22) Date of filing: 23.06.2000
(51) International Patent Classification (IPC)7: G11C 29/00
(86) International application number:
PCT/GR0000/022
(87) International publication number:
WO 0101/422 (04.01.2001 Gazette 2001/01)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

(30) Priority: 23.06.1999 GR 99100210

(71) Applicant: ISD Lisis Olokliromenon Sistimaton S.A.
152 33 Halandri (GR)

(72) Inventors:
  • TSIATOUHAS, George
    GR-152 33 HalandriAthens (GR)
  • HANIOTAKIS, Themistoklis
    GR-152 33 HalandriAthens (GR)

   


(54) BUILT-IN SELF TEST SCHEMES AND TESTING ALGORITHMS FOR RANDOM ACCESS MEMORIES