(19)
(11) EP 1 135 693 A1

(12)

(43) Date of publication:
26.09.2001 Bulletin 2001/39

(21) Application number: 99963010.6

(22) Date of filing: 02.12.1999
(51) International Patent Classification (IPC)7G01R 31/316
(86) International application number:
PCT/US9928/746
(87) International publication number:
WO 0033/096 (08.06.2000 Gazette 2000/23)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 02.12.1998 US 204740

(71) Applicant: FORMFACTOR, INC.
Livermore, CA 94550 (US)

(72) Inventors:
  • ELDRIDGE, Benjamin, N.
    Danville, CA 94523 (US)
  • GRUBE, Gary, W.
    Pleasanton, CA 94588 (US)
  • MATHIEU, Gaetan, L.
    Livermore, CA 94550 (US)

(74) Representative: Käck, Jürgen et al
Kahler, Käck, Fiener et Col.Vorderer Anger 268
86899 Landsberg
86899 Landsberg (DE)

   


(54) PROBE CARD FOR PROBING WAFERS WITH RAISED CONTACT ELEMENTS