(19)
(11) EP 1 145 442 A2

(12)

(43) Date of publication:
17.10.2001 Bulletin 2001/42

(21) Application number: 00959482.1

(22) Date of filing: 28.08.2000
(51) International Patent Classification (IPC)7H03M 1/10
(86) International application number:
PCT/US0023/543
(87) International publication number:
WO 0129/970 (26.04.2001 Gazette 2001/17)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 15.10.1999 US 418808

(71) Applicants:
  • Koninklijke Philips Electronics N.V.
    5621 BA Eindhoven (NL)
  • Philips Semiconductors Inc.
    Sunnyvale, CA 94088 (US)

(72) Inventor:
  • MICHEL, Jean-Yves
    F-06220 Vallauris (FR)

(74) Representative: Duijvestijn, Adrianus Johannes 
Internationaal Octrooibureau B.V.,Prof. Holstlaan 6
5656 AA Eindhoven
5656 AA Eindhoven (NL)

 
Remarks:
WIPO A3 publication data is not currently available.
 


(54) TEST CIRCUIT FOR INTEGRATED ANALOG-TO-DIGITAL CONVERTERS