(19)
(11) EP 1 149 297 A1

(12)

(43) Date of publication:
31.10.2001 Bulletin 2001/44

(21) Application number: 00970560.9

(22) Date of filing: 04.10.2000
(51) International Patent Classification (IPC)7G01R 31/3185
(86) International application number:
PCT/US0027/310
(87) International publication number:
WO 0133/238 (10.05.2001 Gazette 2001/19)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

(30) Priority: 29.10.1999 US 430457

(71) Applicants:
  • Philips Semiconductors Inc.
    Sunnyvale, CA 94088 (US)

    MC 
  • Koninklijke Philips Electronics N.V.
    5621 BA Eindhoven (NL)

    BE CH DE DK ES FI FR GB GR IE IT LU NL PT SE AT CY 

(72) Inventors:
  • LOGSDON, Brian
    Glendale, AZ 85308 (US)
  • JARAMILLO, Ken
    Phoenix, AZ 85022 (US)
  • CHANDRAN, Manoj
    Tempe, AZ 85281 (US)

(74) Representative: Duijvestijn, Adrianus Johannes 
Internationaal Octrooibureau B.V.,Prof. Holstlaan 6
5656 AA Eindhoven
5656 AA Eindhoven (NL)

   


(54) A SCAN TEST POINT OBSERVATION SYSTEM AND METHOD