(19)
(11) EP 1 155 532 A2

(12)

(88) Date of publication A3:
16.11.2000

(43) Date of publication:
21.11.2001 Bulletin 2001/47

(21) Application number: 99967744.6

(22) Date of filing: 29.12.1999
(51) International Patent Classification (IPC)7: H04L 12/26, G01R 31/11
(86) International application number:
PCT/US9931/171
(87) International publication number:
WO 0039/594 (06.07.2000 Gazette 2000/27)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

(30) Priority: 31.12.1998 US 114303 P

(71) Applicant: Big T-1 Company LLC
Hampton, NH 03842 (US)

(72) Inventors:
  • RICHARDSON, William, M.
    Warwick, NY 10990 (US)
  • JUDELL, Neil
    Andover, MA 01810 (US)

(74) Representative: O'Connell, David Christopher 
Haseltine Lake & Co.,Imperial House,15-19 Kingsway
London WC2B 6UD
London WC2B 6UD (GB)

   


(54) COMPUTER NETWORK PHYSICAL-LAYER ANALYSIS METHOD AND SYSTEM