MULTIPLE LAYER CONFOCAL INTERFERENCE MICROSCOPY USING WAVENUMBER DOMAIN REFLECTOMETRY AND BACKGROUND AMPLITUDE REDUCTION AND COMPENSATION - Patent 1161654

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EP 1 161 654 A1

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(43)	Date of publication:
	12.12.2001 Bulletin 2001/50

(21)	Application number: 00918006.8

(22)	Date of filing: 16.03.2000

(51)	International Patent Classification (IPC)⁷: G01B 9/02

(86)	International application number:
	PCT/US0006/914

(87)	International publication number:
	WO 0055/572 (21.09.2000 Gazette 2000/38)

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

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Priority:

18.03.1999 US 125057 P

(71)	Applicant: Zetetic Institute
	Tucson, AZ 85719 (US)

(72)	Inventor:
	HILL, Henry, A. Tucson, AZ 85716 (US)

(74)	Representative: Hartz, Nikolai F., Dr. et al
	Wächtershäuser & Hartz,Patentanwälte,Tal 29 80331 München 80331 München (DE)

(54)	MULTIPLE LAYER CONFOCAL INTERFERENCE MICROSCOPY USING WAVENUMBER DOMAIN REFLECTOMETRY AND BACKGROUND AMPLITUDE REDUCTION AND COMPENSATION