(19)
(11) EP 1 180 244 A2

(12)

(88) Date of publication A3:
26.04.2001

(43) Date of publication:
20.02.2002 Bulletin 2002/08

(21) Application number: 00932407.0

(22) Date of filing: 12.05.2000
(51) International Patent Classification (IPC)7G01N 33/68
(86) International application number:
PCT/US0013/200
(87) International publication number:
WO 0070/353 (23.11.2000 Gazette 2000/47)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 13.05.1999 US 133919 P
09.11.1999 US 164218 P
06.04.2000 US 195159 P

(71) Applicant: Caliper Technologies Corporation
Mountain View, CA 94043 (US)

(72) Inventors:
  • HODGE, C., Nicholas
    Los Altos Hills, CA 94022 (US)
  • KNAPP, Michael, R.
    Redwood City, CA 94062 (US)
  • KOPF-SILL, Anne, R.
    Portola Valley, CA 94028 (US)
  • NIKIFOROV, Theo, T.
    San Jose, CA 95112 (US)
  • PARCE, J., Wallace
    Palo Alto, CA 94303 (US)
  • CHOW, Calvin, Y., H.
    Portola Valley, CA 94028 (US)

(74) Representative: Kiddle, Simon John et al
Mewburn Ellis, York House, 23 Kingsway
London WC2B 6HP
London WC2B 6HP (GB)

   


(54) HIGH TROUGHPUT ASSAY SYSTEMS AND METHODS