(19)
(11) EP 1 183 604 A2

(12)

(88) Date of publication A3:
07.09.2001

(43) Date of publication:
06.03.2002 Bulletin 2002/10

(21) Application number: 00936397.9

(22) Date of filing: 26.05.2000
(51) International Patent Classification (IPC)7G06F 11/00
(86) International application number:
PCT/US0014/768
(87) International publication number:
WO 0073/905 (07.12.2000 Gazette 2000/49)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 27.05.1999 US 136637 P

(71) Applicant: Nanonexus, Inc.
Fremont, CA 94539 (US)

(72) Inventors:
  • CHONG, Fu, Chiung
    Saratoga, CA 95070 (US)
  • MOK, Sammy
    Cupertino, CA 95014 (US)

(74) Representative: Leeming, John Gerard et al
J.A. Kemp & Co., 14 South Square, Gray's Inn
London WC1R 5JJ
London WC1R 5JJ (GB)

   


(54) TEST INTERFACE FOR ELECTRONIC CIRCUIRTS