NUMERICAL APERTURE INCREASING LENS (NAIL) TECHNIQUES FOR HIGH-RESOLUTION SUB-SURFACE IMAGING - Patent 1196792

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EP 1 196 792 A1

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(43)	Date of publication:
	17.04.2002 Bulletin 2002/16

(21)	Application number: 00957981.4

(22)	Date of filing: 20.06.2000

(51)	International Patent Classification (IPC)⁷: G02B 3/00, G11B 7/00

(86)	International application number:
	PCT/US0040/253

(87)	International publication number:
	WO 0079/313 (28.12.2000 Gazette 2000/52)

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

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Priority:

21.06.1999 US 140138 P

(71)	Applicant: TRUSTEES OF BOSTON UNIVERSITY
	Boston, MA 02215 (US)

(72)	Inventors:
	UNLU, M., Selim Jamaica Plain, MA 02130 (US) GOLDBERG, Bennett, B. Newton, MA 02160 (US) IPPOLITO, Stephen, B. Tampa, FL 33602 (US)

(74)	Representative: Skuhra, Udo, Dipl.-Ing. et al
	Reinhard-Skuhra-Weise & PartnerPatentanwältePostfach 44 01 51 80750 München 80750 München (DE)

(54)	NUMERICAL APERTURE INCREASING LENS (NAIL) TECHNIQUES FOR HIGH-RESOLUTION SUB-SURFACE IMAGING