(19)
(11) EP 1 214 577 A1

(12)

(43) Date of publication:
19.06.2002 Bulletin 2002/25

(21) Application number: 00955994.9

(22) Date of filing: 31.08.2000
(51) International Patent Classification (IPC)7G01N 21/35, G01N 21/31, A61B 5/00
(86) International application number:
PCT/CA0001/000
(87) International publication number:
WO 0116/577 (08.03.2001 Gazette 2001/10)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 31.08.1999 US 151537 P

(71) Applicant: CME Telemetrix Inc.
Waterloo,Ontario N2L 5Z4 (CA)

(72) Inventors:
  • SCECINA, Thomas, G.
    Medfield, MA 02052 (US)
  • PAWLUCZYK, Romuald
    Waterloo, Ontario N2L 5P1 (CA)
  • CADELL, Theodore, E.
    Conestogo, Ontario N0B 1N0 (CA)

(74) Representative: Ahmad, Sheikh Shakeel et al
David Keltie Associates,12 New Fetter Lane
London EC4A 1AP
London EC4A 1AP (GB)

   


(54) METHOD FOR DETERMINATION OF ANALYTES USING NIR, ADJACENT VISIBLE SPECTRUM AND DISCRETE NIR WAVELENGTHS