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<ep-patent-document id="EP01129445B8W1" file="EP01129445W1B8.xml" lang="en" country="EP" doc-number="1220393" kind="B8" correction-code="W1" date-publ="20070418" status="c" dtd-version="ep-patent-document-v1-1">
<SDOBI lang="en"><B000><eptags><B001EP>......DE....FRGB................................................................</B001EP><B005EP>J</B005EP><B007EP>DIM360 (Ver 1.5  21 Nov 2005) -  2999001/0</B007EP></eptags></B000><B100><B110>1220393</B110><B120><B121>CORRECTED EUROPEAN PATENT SPECIFICATION</B121></B120><B130>B8</B130><B132EP>B1</B132EP><B140><date>20070418</date></B140><B150><B151>W1</B151><B153>73</B153><B155><B1551>de</B1551><B1552>Bibliographie</B1552><B1551>en</B1551><B1552>Bibliography</B1552><B1551>fr</B1551><B1552>Bibliographie</B1552></B155></B150><B190>EP</B190></B100><B200><B210>01129445.1</B210><B220><date>20011210</date></B220><B240><B241><date>20040803</date></B241><B242><date>20050908</date></B242></B240><B250>en</B250><B251EP>en</B251EP><B260>en</B260></B200><B300><B310>2000376815</B310><B320><date>20001212</date></B320><B330><ctry>JP</ctry></B330><B310>2001110909</B310><B320><date>20010410</date></B320><B330><ctry>JP</ctry></B330><B310>2001249111</B310><B320><date>20010820</date></B320><B330><ctry>JP</ctry></B330></B300><B400><B405><date>20070418</date><bnum>200716</bnum></B405><B430><date>20020703</date><bnum>200227</bnum></B430><B450><date>20070214</date><bnum>200707</bnum></B450><B452EP><date>20060713</date></B452EP><B480><date>20070418</date><bnum>200716</bnum></B480></B400><B500><B510EP><classification-ipcr sequence="1"><text>H01S   5/343       20060101AFI20020508BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>Halbleiterlaservorrichtung mit einer aktiven Schicht aus InGaAs unter Kompressionsdruck, einer Sperrschicht aus GaAsP unter Dehnungsdruck, und einem Lichtwellenleiter aus InGaP</B542><B541>en</B541><B542>Semiconductor laser device having InGaAs compressive-strain active layer, GaAsP tensile-strain barrier layers and InGaP optical waveguide layers</B542><B541>fr</B541><B542>Laser semiconducteur doté d'une couche active d'InGaAs en compression, d'une barrière en GaAsP sous tension et d'un guide d'onde en InGaP</B542></B540><B560><B561><text>EP-A- 0 814 548</text></B561><B561><text>EP-A- 0 936 709</text></B561><B562><text>ZHANG G ET AL: "STRAIN-COMPENSATED INGAAS/GAASP/GAINASP/GAINP QUANTUM WELL LASERS ( ~0.98 UM) GROWN BY GAS-SOURCE MOLECULAR BEAM EPITAXY" APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 62, no. 14, 5 April 1993 (1993-04-05), pages 1644-1646, XP000355014 ISSN: 0003-6951</text></B562><B562><text>VAIL E C ET AL: "BURIED HETEROSTRUCTURE 0.98 M INGAAS/INGAASP/INGAP LASERS" APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 63, no. 16, 18 October 1993 (1993-10-18), pages 2183-2185, XP000404436 ISSN: 0003-6951</text></B562><B562><text>CHO S-Y ET AL: "DEPENDENCE OF OUTPUT PROPERTIES ON RIDGE STRUCTURES AND ASYMMETRIC FACET REFLECTIVITY IN 0.98-MUM INGAAS-INGAASP-INGAP SQW FP-LD'S" IEEE JOURNAL OF QUANTUM ELECTRONICS, IEEE INC. NEW YORK, US, vol. 34, no. 11, November 1998 (1998-11), pages 2217-2223, XP000799014 ISSN: 0018-9197</text></B562><B562><text>MAWST L J ET AL: "MOVPE-grown high CW power InGaAs/InGaAsP/InGaP diode lasers" JOURNAL OF CRYSTAL GROWTH, NORTH-HOLLAND PUBLISHING CO. AMSTERDAM, NL, vol. 170, no. 1-4, 1997, pages 383-389, XP004087139 ISSN: 0022-0248</text></B562><B562><text>TOSHIAKI FUKUNAGA ET AL: "RELIABLE OPERATION OF STRAIN-COMPENSATED 1.06 MUM INGAAS/INGAASP/ GAAS SINGLE QUANTUM WELL LASERS" APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 69, no. 2, 8 July 1996 (1996-07-08), pages 248-250, XP000599652 ISSN: 0003-6951</text></B562><B562><text>SAGAWA M ET AL: "HIGH-POWER HIGHLY-RELIABLE OPERATION OF 0.98-UM INGAAS-INGAP STRAIN-COMPENSATED SINGLE-QUANTUM-WELL LASERS WITH TENSILE-STRAINEDINGAASP BARRIERS" IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, IEEE SERVICE CENTER, US, vol. 1, no. 2, 1 June 1995 (1995-06-01), pages 189-195, XP000521084 ISSN: 1077-260X</text></B562></B560><B590><B598>1C</B598></B590></B500><B700><B720><B721><snm>Fukunaga, Toshiaki,
c/o Fuji Photo Film Co., Ltd.</snm><adr><str>798 Miyanodai,
Kaisei-machi</str><city>Ashigarakami-gun,
Kanagawa-ken</city><ctry>JP</ctry></adr></B721><B721><snm>Ohgoh, Tsuyoshi,
c/o Fuji Photo Film Co., Ltd.</snm><adr><str>798 Miyanodai,
Kaisei-machi</str><city>Ashigarakami-gun,
Kanagawa-ken</city><ctry>JP</ctry></adr></B721></B720><B730><B731><snm>FUJIFILM Corporation</snm><iid>07786510</iid><irf>K 53 684/7ka</irf><adr><str>26-30, Nishiazabu 2-chome</str><city>Minato-ku
Tokyo</city><ctry>JP</ctry></adr></B731></B730><B740><B741><snm>Klunker . Schmitt-Nilson . Hirsch</snm><iid>00101001</iid><adr><str>Winzererstrasse 106</str><city>80797 München</city><ctry>DE</ctry></adr></B741></B740></B700><B800><B840><ctry>DE</ctry><ctry>FR</ctry><ctry>GB</ctry></B840><B880><date>20040602</date><bnum>200423</bnum></B880></B800></SDOBI>
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