FAR-FIELD SCANNING APPARATUS AND METHOD FOR RAPID MEASUREMENT OF LIGHT SOURCE CHARACTERISTICS WITH HIGH DYNAMIC RANGE - Patent 1226411

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EP 1 226 411 A2

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(88)	Date of publication A3:
	17.01.2002

(43)	Date of publication:
	31.07.2002 Bulletin 2002/31

(21)	Application number: 00993119.7

(22)	Date of filing: 27.10.2000

(51)	International Patent Classification (IPC)⁷: G01J 1/04, G01J 1/16, G01J 1/42

(86)	International application number:
	PCT/US0029/514

(87)	International publication number:
	WO 0136/931 (25.05.2001 Gazette 2001/21)

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
	Designated Extension States:
	AL LT LV MK RO SI

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Priority:

03.11.1999 US 163226 P

(71)	Applicant: Photon, Inc.
	San Jose, CA 95119 (US)

(72)	Inventor:
	GUTTMAN, Jeffrey, L. Los Gatos, CA 95033 (US)

(74)	Representative: Turner, James Arthur et al
	D. Young & Co.,21 New Fetter Lane London EC4A 1DA London EC4A 1DA (GB)

(54)	FAR-FIELD SCANNING APPARATUS AND METHOD FOR RAPID MEASUREMENT OF LIGHT SOURCE CHARACTERISTICS WITH HIGH DYNAMIC RANGE