METHOD AND APPARATUS FOR TESTING A CAPACITIVE SENSOR - Patent 1234191

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EP 1 234 191 A1

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(43)	Date of publication:
	28.08.2002 Bulletin 2002/35

(21)	Application number: 00975031.6

(22)	Date of filing: 03.11.2000

(51)	International Patent Classification (IPC)⁷: G01R 35/00, G01R 27/26, G01R 31/28

(86)	International application number:
	PCT/NZ0000/217

(87)	International publication number:
	WO 0103/3245 (10.05.2001 Gazette 2001/19)

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
	Designated Extension States:
	AL LT LV MK RO SI

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Priority:

03.11.1999 NZ 50077099

(71)	Applicant: Med-Dev Limited
	Wellington (NZ)

(72)	Inventors:
	LITTEK, Arnim, Holger Wellington (NZ) POT, Michael, Jouhannes Churton Park (NZ)

(74)	Representative: Murray, Elisabeth Anne et al
	Mathys & Squire,100 Gray's Inn Road London WC1X 8AL London WC1X 8AL (GB)

(54)	METHOD AND APPARATUS FOR TESTING A CAPACITIVE SENSOR