COMPUTER METHOD AND APPARATUS FOR DETERMINING STATE OF PHYSICAL PROPERTIES IN A CHEMICAL PROCESS - Patent 1234219

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EP 1 234 219 A1

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(43)	Date of publication:
	28.08.2002 Bulletin 2002/35

(21)	Application number: 00968615.5

(22)	Date of filing: 03.10.2000

(51)	International Patent Classification (IPC)⁷: G05B 17/02

(86)	International application number:
	PCT/US0027/243

(87)	International publication number:
	WO 0102/5863 (12.04.2001 Gazette 2001/15)

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT
	Designated Extension States:
	AL LT LV MK RO SI

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Priority:

05.10.1999 US 157783 P

(71)	Applicant: Aspen Technology, Inc.
	Cambridge, MA 02141 (US)

(72)	Inventors:
	TREIBER, Steven Toronto, Ontario (CA) SIROHI, Ashuraj North Andover, MA 01845 (US) GHORPADE, Subhash Houston, TX 77063 (US) LINGARD, Simon Arlington, MA 02474 (US) RAMANATHAN, Sundaram Lexington, MA 02421 (US) CHEN, Chau-Chyun Lexington, MA 02173 (US)

(74)	Representative: Driver, Virginia Rozanne et al
	Page White & Farrer54 Doughty Street London WC1N 2LS London WC1N 2LS (GB)

(54)	COMPUTER METHOD AND APPARATUS FOR DETERMINING STATE OF PHYSICAL PROPERTIES IN A CHEMICAL PROCESS