(19)
(11) EP 1 247 078 A1

(12)

(43) Date of publication:
09.10.2002 Bulletin 2002/41

(21) Application number: 00989487.4

(22) Date of filing: 26.12.2000
(51) International Patent Classification (IPC)7G01J 3/51
(86) International application number:
PCT/US0035/274
(87) International publication number:
WO 0104/6659 (28.06.2001 Gazette 2001/26)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

(30) Priority: 23.12.1999 US 471953
23.12.1999 US 471300
13.03.2000 US 524121

(71) Applicant: LJ Laboratories, L.L.C.
Chicago, IL 60610 (US)

(72) Inventors:
  • Jung, Wayne D.
    Morton Grove, IL 60053 (US)
  • Jung, Russell W.
    Morton Grove, IL 60053 (US)
  • Loudermilk, Alan R.
    Chicago, IL 60610 (US)

(74) Representative: von Hellfeld, Axel, Dr. Dipl.-Phys. et al
Wuesthoff & WuesthoffPatent- und RechtsanwälteSchweigerstrasse 2
81541 München
81541 München (DE)

   


(54) APPARATUS AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS OF AN OBJECT OR MATERIAL