(19)
(11) EP 1 287 340 A1

(12)

(43) Date of publication:
05.03.2003 Bulletin 2003/10

(21) Application number: 00939674.8

(22) Date of filing: 08.06.2000
(51) International Patent Classification (IPC)7G01N 21/88, G02B 23/24
(86) International application number:
PCT/US0015/740
(87) International publication number:
WO 0109/4922 (13.12.2001 Gazette 2001/50)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

(71) Applicant: Materials Technologies Corporation
Monroe, CT 06468 (US)

(72) Inventors:
  • PIKE, John, Nazarian
    Pleasantville, NY 10570 (US)
  • MEHROTRA, Yogesh
    Monroe, CT 06468 (US)
  • KAPLAN, Herbert
    Norwalk, CT 06855 (US)

(74) Representative: Heusch, Christian et al
c/o OK pat AG,Chamerstrasse 50
6300 Zug
6300 Zug (CH)

   


(54) APPARATUS AND METHOD FOR VIEWING AND INSPECTING A CIRCUMFERENTIAL SURFACE AREA OF AN OBJECT