(19)
(11) EP 1 322 941 A2

(12)

(88) Date of publication A3:
06.06.2002

(43) Date of publication:
02.07.2003 Bulletin 2003/27

(21) Application number: 01977451.2

(22) Date of filing: 02.10.2001
(51) International Patent Classification (IPC)7G01N 21/95, H01L 21/66
(86) International application number:
PCT/US0131/029
(87) International publication number:
WO 0202/9392 (11.04.2002 Gazette 2002/15)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

(30) Priority: 02.10.2000 US 237297 P
13.07.2001 US 905607

(71) Applicant: Applied Materials, Inc.
Santa Clara,California 95054 (US)

(72) Inventors:
  • DOR, Amos
    Sunnyvale, CA 94087 (US)
  • RADZINSKI, Maya
    Palo Alto, CA 94303 (US)

(74) Representative: Bayliss, Geoffrey Cyril et al
BOULT WADE TENNANT,Verulam Gardens70 Gray's Inn Road
London WC1X 8BT
London WC1X 8BT (GB)

   


(54) DEFECT SOURCE IDENTIFIER