(19)
(11) EP 1 328 971 A2

(12)

(88) Date of publication A3:
15.05.2003

(43) Date of publication:
23.07.2003 Bulletin 2003/30

(21) Application number: 00989275.3

(22) Date of filing: 14.12.2000
(51) International Patent Classification (IPC)7H01L 21/66
(86) International application number:
PCT/US0034/086
(87) International publication number:
WO 0108/0304 (25.10.2001 Gazette 2001/43)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 18.04.2000 US 198464 P
25.08.2000 US 648093

(71) Applicant: KLA-Tencor Corporation
San Jose, CA 95134-1809 (US)

(72) Inventors:
  • SATYA, Akella, V.S.
    Milpitas, CA 95035 (US)
  • PINTO, Gustavo, A.
    Belmont, CA 94002 (US)
  • ADLER, David, L.
    San Jose, CA 95120 (US)
  • LONG, Robert, Thomas
    Santa Cruz, CA 95060 (US)
  • RICHARDSON, Neil
    Palo Alto, CA 94301 (US)
  • WEINER, Kurt, H.
    San Jose, CA 95125 (US)
  • WALKER, David, J.
    Sunol, CA 94586 (US)
  • MANTALAS, Lynda, C.
    Campbell, CA 95008 (US)

(74) Representative: Browne, Robin Forsythe, Dr. 
Urquhart-Dykes & LordTower HouseMerrion Way
Leeds LS2 8PA
Leeds LS2 8PA (GB)

   


(54) IMPROVED TEST STRUCTURES AND METHODS FOR INSPECTING AND UTILIZING THE SAME