(19)
(11) EP 1 350 179 A2

(12)

(88) Date of publication A3:
31.07.2003

(43) Date of publication:
08.10.2003 Bulletin 2003/41

(21) Application number: 01961761.2

(22) Date of filing: 23.07.2001
(51) International Patent Classification (IPC)7: G06F 17/18
(86) International application number:
PCT/US0123/630
(87) International publication number:
WO 0200/8949 (31.01.2002 Gazette 2002/05)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 21.07.2000 US 219697 P

(71) Applicants:
  • Applera Corporation
    Foster City, CA 94404 (US)
  • Breu, Heinz
    Palo Alto, CA 94306 (US)

(72) Inventors:
  • BREU, Heinz
    Palo Alto, CA 94306 (US)
  • PASIKA, Hugh J.
    San Francisco, CA 94110 (US)

(74) Representative: Carter, Stephen John 
Olswang,90 High Holborn
London WC1V 6XX
London WC1V 6XX (GB)

   


(54) METHODS AND SYSTEMS FOR EVALUATING A MATCHING BETWEEN MEASURED DATA AND STANDARDS