(19)
(11) EP 1 359 426 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
07.01.2004 Bulletin 2004/02

(43) Date of publication A2:
05.11.2003 Bulletin 2003/45

(21) Application number: 03252374.8

(22) Date of filing: 15.04.2003
(51) International Patent Classification (IPC)7G01R 13/00, G01R 19/25, G01R 31/28, G01R 31/319
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR
Designated Extension States:
AL LT LV MK

(30) Priority: 23.04.2002 US 128387

(71) Applicant: Agilent Technologies, Inc.
Palo Alto, CA 94306 (US)

(72) Inventor:
  • Sutton, Christopher K.
    Everett, WA 98203 (US)

(74) Representative: Powell, Stephen David et al
WILLIAMS POWELL Morley House 26-30 Holborn Viaduct
London EC1A 2BP
London EC1A 2BP (GB)

   


(54) Electronic device testing


(57) An electronic test system (100) that distinguishes erroneous and marginal results includes a memory (101) and an electronic processor (102) for controlling the execution of the test, obtaining test results and generating test results. The test results include a determination (330) of whether the condition of the test datapoints is pass, fail, error or marginal, where pass indicates that the DUT has met a specification, fail indicates that the DUT has not met the specification, error indicates that the test system or interface to the DUT has failed, and marginal indicates that the system is marginally within specification. The test results are displayed on a graphical user interface (300). The test system provides the ability to control the progress of the test system based on the results. For example, the system can be programmed to stop on erroneous results, marginal results, failed results, combinations of the forgoing, or stop after each measurement. When the system stops, a drop-down window (600) appears explaining the reason for the stoppage.







Search report