(19)
(11) EP 1 370 881 A2

(12)

(88) Date of publication A3:
18.09.2003

(43) Date of publication:
17.12.2003 Bulletin 2003/51

(21) Application number: 02701504.9

(22) Date of filing: 05.03.2002
(51) International Patent Classification (IPC)7G01R 31/3183
(86) International application number:
PCT/IB0200/681
(87) International publication number:
WO 0207/1082 (12.09.2002 Gazette 2002/37)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

(30) Priority: 08.03.2001 EP 01200874
09.03.2001 EP 01200897
21.12.2001 EP 01403353

(71) Applicant: Koninklijke Philips Electronics N.V.
5621 BA Eindhoven (NL)

(72) Inventors:
  • BOS, Gerardus, A., A.
    NL-5656 AA Eindhoven (NL)
  • VRANKEN, Hendrikus, P., E.
    NL-5656 AA Eindhoven (NL)
  • WAAYERS, Thomas, F.
    NL-5656 AA Eindhoven (NL)
  • LELOUVIER, David
    NL-5656 AA Eindhoven (NL)
  • FLEURY, Herve
    NL-5656 AA Eindhoven (NL)

(74) Representative: Duijvestijn, Adrianus Johannes 
PhilipsIntellectual Property & StandardsP.O. Box 220
5600 AE Eindhoven
5600 AE Eindhoven (NL)

   


(54) METHOD FOR TESTING AN ELECTRONIC DEVICE