(19)
(11) EP 1 370 940 A2

(12)

(88) Date of publication A3:
09.10.2003

(43) Date of publication:
17.12.2003 Bulletin 2003/51

(21) Application number: 01980470.7

(22) Date of filing: 02.10.2001
(51) International Patent Classification (IPC)7: G06F 11/00
(86) International application number:
PCT/EP0111/402
(87) International publication number:
WO 0202/9569 (11.04.2002 Gazette 2002/15)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

(30) Priority: 02.10.2000 US 677937

(71) Applicant: Koninklijke Philips Electronics N.V.
5621 BA Eindhoven (NL)

(72) Inventors:
  • JARAMILLO, Kenneth
    NL-5656 AA Eindhoven (NL)
  • VAJJHALA, Varaprasda
    NL-5656 AA Eindhoven (NL)

(74) Representative: Duijvestijn, Adrianus Johannes et al
PhilipsIntellectual Property & StandardsP.O. Box 220
5600 AE Eindhoven
5600 AE Eindhoven (NL)

   


(54) A SYSTEM AND METHOD TO ENHANCE MANUFACTURING TEST FAILURE ANALYSIS WITH DEDICATED PINS