(19)
(11) EP 1 376 555 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
14.01.2009 Bulletin 2009/03

(45) Mention of the grant of the patent:
12.11.2008 Bulletin 2008/46

(21) Application number: 02705483.2

(22) Date of filing: 25.03.2002
(51) International Patent Classification (IPC): 
G11B 7/09(2006.01)
 G11B 7/085(2006.01)
(86) International application number:
PCT/JP2002/002864
(87) International publication number:
WO 2002/080156 (10.10.2002 Gazette 2002/41)

(54)

OFFSET MEASURING METHOD

OFFSET-MESSVERFAHREN

PROCEDE DE MESURE DE DECALAGE

(84) Designated Contracting States:
DE FR GB

(30) Priority: 29.03.2001 JP 2001095735

(43) Date of publication of application:
02.01.2004 Bulletin 2004/01

(73) Proprietor: Panasonic Corporation
Kadoma-shi Osaka 571-8501 (JP)

(72) Inventors:
  • KITAYAMA, Machiko
    Nara-shi, Nara 634-0024 (JP)
  • KUWAHARA, Masaya
    Suita-shi, Osaka 565-0821 (JP)
  • TAI, Yasuhiro
    Kadoma-shi, Osaka 571-0031 (JP)

(74) Representative: Holmes, Miles Keeton et al
Novagraaf International S.A. 25, avenue du Pailly
1220 Les Avanchets, Geneva
1220 Les Avanchets, Geneva (CH)


(56) References cited: : 
EP-A- 0 840 295
JP-A- 2000 222 749
JP-A- 2000 251 289
 JP-A- 8 194 540
JP-A- 2000 222 749
US-A- 5 917 789
   
       
    Note: Within nine months from the publication of the mention of the grant of the European patent, any person may give notice to the European Patent Office of opposition to the European patent granted. Notice of opposition shall be filed in a written reasoned statement. It shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).