<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE ep-patent-document PUBLIC "-//EPO//EP PATENT DOCUMENT 1.3//EN" "ep-patent-document-v1-3.dtd">
<ep-patent-document id="EP02705483B8W1" file="EP02705483W1B8.xml" lang="en" country="EP" doc-number="1376555" kind="B8" correction-code="W1" date-publ="20090114" status="c" dtd-version="ep-patent-document-v1-3">
<SDOBI lang="en"><B000><eptags><B001EP>......DE....FRGB................................................................</B001EP><B005EP>J</B005EP><B007EP>DIM360 Ver 2.15 (14 Jul 2008) -  2999001/0</B007EP></eptags></B000><B100><B110>1376555</B110><B120><B121>CORRECTED EUROPEAN PATENT SPECIFICATION</B121></B120><B130>B8</B130><B132EP>B1</B132EP><B140><date>20090114</date></B140><B150><B151>W1</B151><B153>73</B153><B155><B1551>de</B1551><B1552>Bibliographie</B1552><B1551>en</B1551><B1552>Bibliography</B1552><B1551>fr</B1551><B1552>Bibliographie</B1552></B155></B150><B190>EP</B190></B100><B200><B210>02705483.2</B210><B220><date>20020325</date></B220><B240><B241><date>20021112</date></B241></B240><B250>ja</B250><B251EP>en</B251EP><B260>en</B260></B200><B300><B310>2001095735</B310><B320><date>20010329</date></B320><B330><ctry>JP</ctry></B330></B300><B400><B405><date>20090114</date><bnum>200903</bnum></B405><B430><date>20040102</date><bnum>200401</bnum></B430><B450><date>20081112</date><bnum>200846</bnum></B450><B452EP><date>20080530</date></B452EP><B480><date>20090114</date><bnum>200903</bnum></B480></B400><B500><B510EP><classification-ipcr sequence="1"><text>G11B   7/09        20060101AFI20021014BHEP        </text></classification-ipcr><classification-ipcr sequence="2"><text>G11B   7/085       20060101ALI20021014BHEP        </text></classification-ipcr></B510EP><B540><B541>de</B541><B542>OFFSET-MESSVERFAHREN</B542><B541>en</B541><B542>OFFSET MEASURING METHOD</B542><B541>fr</B541><B542>PROCEDE DE MESURE DE DECALAGE</B542></B540><B560><B561><text>EP-A- 0 840 295</text></B561><B561><text>JP-A- 8 194 540</text></B561><B561><text>JP-A- 2000 222 749</text></B561><B561><text>JP-A- 2000 222 749</text></B561><B561><text>JP-A- 2000 251 289</text></B561><B561><text>US-A- 5 917 789</text></B561><B565EP><date>20080215</date></B565EP></B560></B500><B700><B720><B721><snm>KITAYAMA, Machiko</snm><adr><str>5-3-6, Hyakurakuen</str><city>Nara-shi, Nara 634-0024</city><ctry>JP</ctry></adr></B721><B721><snm>KUWAHARA, Masaya</snm><adr><str>3-18-30-404, Yamadahigashi</str><city>Suita-shi, Osaka 565-0821</city><ctry>JP</ctry></adr></B721><B721><snm>TAI, Yasuhiro</snm><adr><str>5-30-102, Furukawacho</str><city>Kadoma-shi, Osaka 571-0031</city><ctry>JP</ctry></adr></B721></B720><B730><B731><snm>Panasonic Corporation</snm><iid>08777040</iid><irf>BB 48194</irf><adr><str>1006, Oaza Kadoma</str><city>Kadoma-shi
Osaka 571-8501</city><ctry>JP</ctry></adr></B731></B730><B740><B741><snm>Holmes, Miles Keeton</snm><sfx>et al</sfx><iid>00072833</iid><adr><str>Novagraaf International S.A. 
25, avenue du Pailly</str><city>1220 Les Avanchets,
Geneva</city><ctry>CH</ctry></adr></B741></B740></B700><B800><B840><ctry>DE</ctry><ctry>FR</ctry><ctry>GB</ctry></B840><B860><B861><dnum><anum>JP2002002864</anum></dnum><date>20020325</date></B861><B862>ja</B862></B860><B870><B871><dnum><pnum>WO2002080156</pnum></dnum><date>20021010</date><bnum>200241</bnum></B871></B870><B880><date>20040102</date><bnum>200401</bnum></B880></B800></SDOBI>
</ep-patent-document>
