LOW-JITTER CLOCK FOR TEST SYSTEM - Patent 1377841

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EP 1 377 841 A2

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(88)	Date of publication A3:
	23.10.2003

(43)	Date of publication:
	07.01.2004 Bulletin 2004/02

(21)	Application number: 02725274.1

(22)	Date of filing: 19.03.2002

(51)	International Patent Classification (IPC)⁷: G01R 31/00

(86)	International application number:
	PCT/US2002/008627

(87)	International publication number:
	WO 2002/075337 (26.09.2002 Gazette 2002/39)

(84)	Designated Contracting States:
	AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
	Designated Extension States:
	AL LT LV MK RO SI

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Priority:

20.03.2001 US 277675 P
21.03.2001 US 277795 P

(71)	Applicant: Nptest, Inc.
	San Jose, CA 95134 (US)

(72)	Inventors:
	DALLA RICCA, Paolo Freemont, CA 94539 (US) WEST, Burnell, G. Fremont, CA 94539 (US)

(74)	Representative: Wombwell, Francis et al
	Potts, Kerr & Co.15, Hamilton Square BirkenheadMerseyside CH41 6BR BirkenheadMerseyside CH41 6BR (GB)

(54)	LOW-JITTER CLOCK FOR TEST SYSTEM