Field of the Invention
[0001] This invention relates to the copying (often referred to as 'mirroring') of currents
in electronic circuits. Such current copying or mirroring is widely used in electronic
circuits for purposes such as regulation.
Background of the Invention
[0002] In the field of this invention it is known that to copy the current of a power MOSFET
(Metal-Oxide-Semiconductor Field-Effect Transistor), a well-known technique is to
design another (typically small) transistor to serve as a sense FET, and to design
a loop with an amplifier to force the same voltage on the drains of both the power
transistor and the sense transistor. In this way, the current in the sense transistor
is proportional to (typically less than) current in the power transistor.
[0003] A known example of this technique to copy or mirror current of a high- or low-side
power switch uses a feedback loop with a high gain amplifier to match both drain voltages.
However, if a high gain amplifier is used, capacitor compensation is required to ensure
closed-loop stability, and this makes the circuit slower.
[0004] Additionally, accuracy in such an arrangement is determined by the input offset and
the input error (output voltage divided by the open-loop gain), and even if the offset
is close to zero, input error will still be produced. A high gain amplifier (sometimes
2 stages, e.g., with gain in the range of 1,000) is needed to decrease this error.
[0005] A problem to be solved with this example is to copy or mirror the current of the
high or low side power switch, without using a high gain voltage amplifier.
[0006] A need therefore exists for accurate and fast current copying or mirroring circuit
for high current ratio wherein the abovementioned disadvantage(s) may be alleviated.
Statement of Invention
[0007] The present invention provides a copy current circuit arrangement and a method for
copying current in a circuit arrangement as described in the accompanying claims.
Brief Description of the Drawings
[0008] Two accurate and fast copy current circuit arrangements and methods for high current
ratio incorporating the present invention will now be described, by way of example
only, with reference to the accompanying drawings, in which:
FIG. 1A and FIG. 1B show prior art copy-current circuits for use in a low-side power
switch and a high-side power switch respectively;
FIG. 2 shows a schematic circuit diagram of a copy-current circuit for use in a high-side
power switch in accordance with an embodiment of the present invention, given by way
of example;
FIG. 3 shows a schematic circuit diagram of an improved copy-current circuit, developed
from the circuit of FIG. 2, for use in a high-side power switch;
FIG. 4A and FIG. 4B show a simplified schematic re-drawing of the circuit of FIG.
2 and a similar complementary-type circuit respectively;
FIG. 5 shows a simplified re-drawing of the circuit of FIG. 2 based on the schematic
of FIG. 4A or FIG. 4B; and
FIG. 6A and 6B show simplified source-up and source-down variants of the circuit of
FIG. 5.
Description of Preferred Embodiments
[0009] Referring firstly to FIG. 1A, a copy-current low-side switch circuit 100 includes
a power FET 110 which has its drain connected to a supply voltage rail
Vbat, via a load resistance
rload, and which has its source connected to ground voltage
Gnd. A sense FET 120 has its source connected to the ground voltage
Gnd. The drains of the FETs 110 and 120 are connected to respective inputs of a differential
amplifier 130. The output of the amplifier 130 is connected to the gate of an FET
140, whose source is connected to the drain of the sense FET 120. The gates of the
power FET 110 and the sense FET 120 are connected to receive a switching control voltage.
In use, the load current
iload carried by the power FET 110 is copied or mirrored in the output current
iout carried by the sense FET 120 and the FET 140. The copied or mirrored current
iout is related to the load current
iload by the equation

where
k = Aout/
As, Aout is the area of the power FET 110 and
As is the area of the sense FET 120.
[0010] It will be understood that the amplifier 130 has high impedance inputs; it will also
be understood that in order to ensure stability of the amplifier feedback loop capacitance
(shown symbolically within the amplifier 130) must be provided in the feedback loop,
and that this capacitance creates a delay in the current.
[0011] Referring now also to FIG. 1B, a copy-current high-side switch circuit 150 includes
a power FET 160 which has its drain connected to a supply voltage rail
Vbat, and which has its source connected, via a load resistance
Rload, to ground voltage
Gnd. A sense FET 170 has its drain connected to the supply voltage rail
Vbat. The sources of the FETs 160 and 170 are connected to respective inputs of a differential
amplifier 180. The output of the amplifier 180 is connected to the gate of an FET
190, whose drain is connected to the source of the sense FET 170 and whose source
is connected via a feedback resistor
Rifb to the ground voltage
Gnd. The gates of the power FET 160 and the sense FET 170 are connected to receive a switching
control voltage. In use, a power output voltage
Vout is developed at the source of the power FET 160 and a sense voltage
Vs is developed at the source of the sense FET 190 (giving rise to an error voltage
Vε between the inputs of the amplifier 180), and a current feedback voltage
Vifb is developed at the drain of the sense FET 190, the error voltage
Vε being given by the equation

where
offset is the offset voltage of the amplifier 180 and
A is its open-loop gain. The load current
Iload carried by the power FET 160 is copied or mirrored in the feedback current
Ifb carried by the sense FET 170 and the FET 190. The copied or mirrored current
Ifb is related to the load current
Iload by the equation

where
K = Aout/
As, Aout being the area of the power FET 160 and
As being the area of the sense FET 170.
[0012] It will be understood that

gives, in practice, for example, a 1mV error for
Vout = 1V and
A = 1000, and that the error voltage changes with V
ifb.
[0013] Referring now to FIG. 2, the copy-current high-side switch circuit 250 shown, which
is in accordance with an embodiment of the present invention, includes a power FET
260 which has its drain connected to a supply voltage rail
Vbat, and which has its source connected, via a load resistance
Rload, to ground voltage
Gnd. A sense FET 270 has its drain connected to the supply voltage rail
Vbat. The sources of the FETs 260 and 270 are connected to respective emitters of PNP
bipolar transistors 282 and 284, whose bases are connected to each other and to the
collector of PNP transistor 282. Two FET transistors 286 and 288 have their drains
connected respectively to the collectors of the PNP transistors 282 and 284. The FETs
286 and 288 have their sources connected via a feedback resistor
Rfb to the ground voltage
Gnd. The gates of the FETs 286 and 288 are connected together and to the drain of the
FET 288. A start-up current source 299 is connected between the collector of PNP transistor
282 and the ground voltage
Gnd. The gates of the power FET 260 and the sense FET 270 are connected to receive a switching
control voltage.
[0014] As can be seen by comparing the circuit of FIG. 2 with that of FIG. 1B, essentially
the voltage amplifier 180 of FIG. 1B has been replaced by a twisted current mirror
arrangement (284/282 - 288/286). These current mirrors have a gain of 1, forcing both
branches (284 & 288 and 282 & 286) to have the same current (named
Ifb), whatever the current value.
[0015] As the gain of the mirror (284/282 - 288/286) is 1, the differential offset between
its inputs (
Vout-Vs) has to be zero, if the offset is zero.
[0016] In use it will be appreciated that the twisted current mirror arrangement (282, 284,
286, 288) is used to create a current source by generating a
"ΔVbe/
R", ΔVbe being generated by a different area between transistors 282 and 284 (
ΔVbe = offset). This twisted current mirror arrangement in this particular application produces
an image of the current. So to compare with the current source generation, an
offset of zero is used, assuming the
Vout voltage is a source voltage (very low impedance) and this source voltage is applied
across the sense resistor (sense FET resistance), to generate

It will be understood that basically this circuit allows copying of a voltage (without
gain offset), from a low impedance voltage source across a resistor.
[0017] It will therefore be appreciated that the circuit of FIG. 3 produces the same result
(V
out-V
s=0) as that of FIG. 1B, but without using a voltage loop and a voltage amplifier.
In the circuit of FIG. 2 the voltage
Vbat - Vout is given by the load current through the power MOS 282. This voltage is copied on
the sense FET 284, because the differential voltage (
Vout - Vs) is zero.
[0018] The two currents
Ifb in the branches of the twisted current mirror arrangement 282-288 go through the
Rifb resistor, creating a voltage
Vifb, which is the image of the current in the load.
[0019] It will be appreciated that a significant difference between this new topology shown
in FIG. 2 and the standard architecture shown in FIG. 1B is that the twisted current
mirror arrangement (282-288) provides a high impedance input and so doesn't create
any current error on the branches.
[0020] It can be shown that, comparing the performance of the circuit of FIG. 2 with that
of FIG. 1B, with typical values of
K = 1000 ,
A = 1000,
offset = 1
mV,
Iload = 1
A,
Rload = 20mΩ,
Vbat-
Vout = 20
mV , although an error current of 0.1% may be produced in the FIG. 2 circuit compared
with an error current of 0% in the FIG. 1B circuit, an error voltage of 20% may be
produced in the FIG. 1B circuit compared with an error voltage of only 5% in the FIG.
2 circuit. It will be appreciated that this improvement in error voltage, in spite
of a worsening of error current, is advantageous because the circuit is much less
sensitive to current error than to voltage error.
[0021] Referring now also to FIG. 3, in an improved version 300 of the circuit of FIG. 2,
like components are denoted by the same reference numbers. As can be seen from comparing
the circuit of FIG. 3 with of FIG. 2, added components in the circuit of FIG. 3 include
NPN bipolar transistors 283 and 285 having their bases connected to the collectors
of the PNP transistors 282 and 284 respectively; the collectors of the NPN transistors
283 and 285 are connected to the emitters of the PNP transistors 282 and 284 respectively;
and the emitters of the NPN transistors 283 and 285 are connected to their bases via
resistors 283' and 285' respectively. A MOS transistor 292 has its gate and source
connected to the source of the MOS transistor 296. A MOS transistor 294 has its drain
connected to the drains of the MOS transistors 286 and 288, and has its source connected
via the current feedback resistance
Rifb to the ground voltage
Gnd. A MOS transistor 296 has its gate and source connected to the gate of the MOS transistor
294; the drain of the MOS transistor 296 is connected to the drain of the MOS transistor
292; and the source of the MOS transistor is connected via the start-up current source
299 to the ground voltage
Gnd. A MOS transistor 298 has its drain connected to the bases of the PNP transistors
282 and 284, has its source connected to the drains of the MOS transistors2865 and
288, and has its gate connected to the source of the MOS transistor 286.
[0022] It will be appreciated that the NPN bipolar transistors 283 and 285 allows the circuit
300 to drive more current. It will also be appreciated that the MOS transistors 294
and 296 allow the circuit 300 to sustain higher
Vbat voltage. It will also be appreciated that the MOS transistor 298 improves operation
of the bipolar current mirror 282 and 284 by bringing the current ratio closer to
unity, due to base current compensation as follows. Considering the circuit of FIG.
2, the base currents of bipolar transistors 284 and 282 are injected in the MOS transistor
286 in addition to the collector current of the bipolar transistor 282. This results
in the ratio current in the MOS transistors 286 and 288 being not exactly equal to
unity, but instead (
ic + 2.
ib)/
ic, the 2
.ib factor clearly giving rise to current ratio error. In the circuit of FIG 3, the MOS
transistor 298 injects those two base currents (2.
ib) into the feedback resistance
Rifb through the MOS transistor 294. Since the gate of the MOS transistor 298 has no current,
the MOS transistors 286 and 288 will see the ratio current close to unity.
[0023] It will also be understood that the MOS transistor 292 compensates for the
Vgs of the MOS transistor 288 and allows the voltages at the sources of the MOS transistors
286 and 288 to be substantially equalised (MOS transistors 286 and 288 having the
same
Vds for good matching). Finally, it will be appreciated that the start-up current source
299 can stay on (for example at a low current of 10µA), providing bias for the MOSFET
transistors 296 and 292. Thus, in conclusion, it will be understood that the modifications
of FIG. 3 provide improved matching to obtain a current mirror gain as close as possible
to 1, to minimize the offset by design.
[0024] In summary, it will be understood that the new copy current circuit for high current
ratio described above in relation to FIG. 2 and FIG. 3 provides the following advantages:
More accurate copy current for high current ratio (for example, greater than 1000)
- Better linearity because Vifb variation doesn't introduce input error
- Faster response time due to no feed back loop capacitor
- 0mV input error voltage (Ifb not created by an amplifier)
- Simpler circuit design
[0025] Finally, it will be understood that although the new copy current circuits for high
current ratio described above in relation to FIG. 2 and FIG. 3 have presented the
invention in the context of High-side switches, the invention could equally be applied
to low-side switch circuits.
[0026] Referring now to FIG. 4A, it will be appreciated that the circuit 250 of FIG. 2 can
be considered as made up of P-type current mirror 410 (comprising bipolar PNP transistors
282 and 284) and NMOS current mirror 420 (comprising NMOS transistors 286 and 288),
each of these current mirrors having inputs
in and
sd_in and having outputs
out and
sd_out. Similarly, referring now to FIG. 4B, it will be appreciated that an complementary-type
version of the circuit can be considered as made up of N-type current mirror 430 (comprising
bipolar NPN transistors) and PMOS current mirror 440 (comprising PMOS transistors),
each of these current mirrors having inputs
in and
sd_in and having outputs
out and
sd_out.
[0027] It will be appreciated that, based on the current mirrors 410 and 420, the circuit
of FIG. 2 can be re-drawn as shown in FIG. 5. As shown, the bipolar transistor current
mirror 410 is supplied from supply voltage
Vbat via a resistor
R and low impedance voltage source
V respectively, the low impedance source
V being generated by the power FET 260 and the load, and the resistor
R representing the on-state drain-to-source resistance (
rdson) of the FET sense transistor 270 of FIG. 2. It will be understood that
V =
Vbat-Vout, which will be copied across the resistor
R and so the voltage error
Vε will be 0mV due to no loop gain. The only voltage between
sd_out and
sd_in can be the offset of the structure (components unmatched).
[0028] FIG. 6A shows a version of the circuit of FIG. 5, working when the source voltage
is connected to
Vbat (source up), in which the current feedback resistor
Rifb is not shown for simplicity. Similarly, FIG. 6B shows a complementary version of
the circuit of FIG. 5, working when the source voltage is connected to the
Gnd (source down). It will be understood that the current mirror 410 of FIG. 6A could
be replaced by the current mirror 440 (since any P-type current mirror could be used
at this position), and the current mirror 420 of FIG. 6A could be replaced by the
current mirror 430 (since any N-type current mirror could be used at this position);
similarly, it will be understood that the current mirror 440 of FIG. 6B could be replaced
by the current mirror 410 (since any P-type current mirror could be used at this position),
and the current mirror 430 of FIG. 6B could be replaced by the current mirror 420
(since any N-type current mirror could be used at this position). It will be appreciated
that in both the circuit of FIG. 6A and 6B (and also in the circuit of FIG. 5), the
output current
I is generally given by
I = 
[0029] Thus it will be appreciated that the output current
I is generated by applying a voltage
V across
R without using an amplifier having a closed loop of unity gain.
[0030] It will therefore be appreciated that the circuit 250 of FIG. 2 is a particular case
of the general circuit of FIG. 5 (and 6A), the voltage generator
Vout being the voltage across the drain-to-source of the power MOS transistor 260, the
resistor
R being the resistance of the sense MOS transistor 270, and the current output going
directly through the current feedback resistor
Rifb to create the voltage
Vifb.
[0031] Thus it will be understood that the general circuits of FIG. 6A and 6B can be used
in other circuits other than a copy current in a power switch, for example where it
is desired to transform a voltage to a current without error voltage and without using
a closed loop amplifier, where the source impedance is small compare to the output
impedance
R. If the internal impedance of the source is not negligible (but known, as in the case
where it is desired to copy a voltage across a resistor
Rin biased by a current source), the internal impedance of the source can be compensated
by adding the same impedance R
in in series with the output resistor
R to compensate error due to internal impedance.
[0032] Another possible application involves an EEPROM cell, where for example an NMOS transistor
in block 420 (FIG. 4A) is replaced by a EEPROM cell (effectively an NMOS transistor
with adjustable threshold voltage). If in this block the MOS transistor 288 has a
threshold of 1
V over the transistor MOS transistor 286, this is equivalent to the FIG. 6B arrangement
with a voltage
V of 1
V and standard NMOS transistors.
1. A copy current circuit arrangement (250), comprising:
a first branch for carrying a first current (Iload);
a second branch for carrying a second current (2Ifb); and
current mirror means (282, 284, 286, 288) coupled between the first branch and the
second branch, wherein the second current (2Ifb) is a copy representative of the first current (Iload).
2. The copy current circuit arrangement as claimed in claim 1, wherein the current mirror
means (282, 284, 286, 288) comprises:
first current mirror means (282, 284) comprising a first bipolar transistor (282)
and a second bipolar transistor (284), the first and second bipolar transistors having
their bases coupled together;
second current mirror means (286, 288) comprising a first MOSFET transistor (286)
connected in series with the first bipolar transistor (282) and a second MOSFET transistor
(288) connected in series with the second bipolar transistor (284), the first and
second MOSFET transistors having their gates coupled together; and
start-up current means (299) arranged to apply a start-up current to the junction
between the first bipolar transistor (282) and the first MOSFET transistor (286).
3. The copy current circuit arrangement as claimed in claim 2, wherein the first (282)
and second (284) bipolar transistors are PNP transistors.
4. The copy current circuit arrangement as claimed in claim 2 or 3, wherein
the first current mirror means further comprises:
a third bipolar transistor (283) of opposite conductivity type to the first bipolar
transistor (282), the base of the third bipolar transistor (283) being coupled to
the collector of the first bipolar transistor (282), the collector of the third bipolar
transistor (283) being coupled to the emitter of the first bipolar transistor (282),
and the emitter of the third bipolar transistor (283) being coupled to the collector
of the first bipolar transistor (282) and to the first MOSFET transistor (286); and
a fourth bipolar transistor (285) of opposite conductivity type to the second bipolar
transistor (284), the base of the fourth bipolar transistor (285) being coupled to
the collector of the second bipolar transistor (284), the collector of the fourth
bipolar transistor (285) being coupled to the emitter of the second bipolar transistor
(284), and the emitter of the fourth bipolar transistor (285) being coupled to the
collector of the second bipolar transistor (284) and to the second MOSFET transistor
(288).
5. The copy current circuit arrangement as claimed in claim 2, 3 or 4, wherein the second
current mirror means comprises:
a third MOSFET transistor (294) coupled in series with the second MOSFET transistor
(288), and a fourth MOSFET transistor (296) coupled in series with the start-up current
means, the third MOSFET transistor (294) and the fourth MOSFET transistor (296) having
their gates coupled together.
6. The copy current circuit arrangement as claimed in claim 5, further comprising a sixth
MOSFET transistor (292) coupled in series with the fourth MOSFET transistor (296),
the gate and source of the sixth MOSFET transistor (292) being coupled together and
to the junction between the first bipolar transistor (282) and the first MOSFET transistor
(286).
7. The copy current circuit arrangement as claimed in any one of claims 2-6, further
comprising a seventh MOSFET transistor (298) coupled in series between the bases of
the first (282) and second (284) bipolar transistors and the drain electrodes of the
third (294) and fourth MOSFET transistors (296), the gate of the seventh MOSFET transistor
(298) being coupled to the junction between the first bipolar transistor (282) and
the first MOSFET transistor (286).
8. The copy current circuit arrangement as claimed in any preceding claim, wherein the
first (Iload) and second currents (2lfb) are in a ratio of the order of 1000.
9. The copy current circuit arrangement as claimed in any preceding claim, wherein the
first branch comprises power switch means (260).
10. The copy current circuit arrangement as claimed in any one of claims 2-9, wherein
the start-up current means is arranged also to provide bias during circuit operation.
11. The copy current circuit arrangement as claimed in any preceding claim wherein the
copy current circuit arrangement comprises a source-up circuit.
12. The copy current circuit arrangement as claimed in any one of claims 1-11 wherein
the copy current circuit arrangement comprises a source-down circuit.
13. A method for copying current in a circuit arrangement (250), the method comprising:
providing a first branch for carrying a first current (Iload);
providing a second branch for carrying a second current (2Ifb); and
providing current mirror means (282, 284, 286, 288) coupled between the first branch
and the second branch, wherein the second current (2Ifb) is a copy representative of the first current (Iload).
14. The method as claimed in claim 13, wherein the current mirror means (282, 284, 286,
288) comprises:
first current mirror means (282, 284) comprising a first bipolar transistor (282)
and a second bipolar transistor (284), the first and second bipolar transistors having
their bases coupled together;
second current mirror means (286, 288) comprising a first MOSFET transistor (286)
connected in series with the first bipolar transistor (282) and a second MOSFET transistor
(288) connected in series with the second bipolar transistor (284), the first and
second MOSFET transistors having their gates coupled together; and
start-up current means (299) arranged to apply a start-up current to the junction
between the first bipolar transistor (282) and the first MOSFET transistor (286).
15. The method as claimed in claim 14, wherein the first (282) and second (284) bipolar
transistors are PNP transistors.
16. The method as claimed in claim 14 or 15, wherein the first current mirror means further
comprises:
a third bipolar transistor (283) of opposite conductivity type to the first bipolar
transistor (282), the base of the third bipolar transistor (283) being coupled to
the collector of the first bipolar transistor (282), the collector of the third bipolar
transistor (283) being coupled to the emitter of the first bipolar transistor (282),
and the emitter of the third bipolar transistor (283) being coupled to the collector
of the first bipolar transistor (282) and to the first MOSFET transistor (286); and
a fourth bipolar transistor (285) of opposite conductivity type to the second bipolar
transistor (284), the base of the fourth bipolar transistor (285) being coupled to
the collector of the second bipolar transistor (284), the collector of the fourth
bipolar transistor (285) being coupled to the emitter of the second bipolar transistor
(284), and the emitter of the fourth bipolar transistor (285) being coupled to the
collector of the second bipolar transistor (284) and to the second MOSFET transistor
(288).
17. The method as claimed in claim 14, 15 or 16, wherein the second current mirror means
comprises:
a third MOSFET transistor (294) coupled in series with the second MOSFET transistor
(288), and a fourth MOSFET transistor (296) coupled in series with the start-up current
means, the third MOSFET transistor (294) and the fourth MOSFET transistor (296) having
their gates coupled together.
18. The method as claimed in claim 17, further comprising a sixth MOSFET transistor (292)
coupled in series with the fourth MOSFET transistor (296), the gate and source of
the sixth MOSFET transistor (292) being coupled together and to the junction between
the first bipolar transistor (282) and the first MOSFET transistor (286).
19. The method as claimed in any one of claims 14-18, further comprising a seventh MOSFET
transistor (298) coupled in series between the bases of the first (282) and second
(284) bipolar transistors and the drain electrodes of the third (294) and fourth MOSFET
transistors (296), the gate of the seventh MOSFET transistor (298) being coupled to
the junction between the first bipolar transistor (282) and the first MOSFET transistor
(286).
20. The method as claimed in any one of claims 13-19, wherein the first (Iload) and second current (2Ifb) are in a ratio of the order of 1000.
21. The method as claimed in any one of claims 13-20, wherein the first branch comprises
power switch means (260).
22. The method as claimed in any one of claims 14-21, wherein the start-up current means
also provides bias during circuit operation.
23. The method as claimed in any one of claims 13-22 wherein the circuit arrangement comprises
a source-up circuit.
24. The method as claimed in any one of claims 13-22 wherein the circuit arrangement comprises
a source-down circuit.