(19)
(11) EP 1 407 220 A1

(12)

(43) Date of publication:
14.04.2004 Bulletin 2004/16

(21) Application number: 02747900.5

(22) Date of filing: 18.06.2002
(51) International Patent Classification (IPC)7G01B 9/02
(86) International application number:
PCT/US2002/018983
(87) International publication number:
WO 2002/103285 (27.12.2002 Gazette 2002/52)
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 19.06.2001 US 883296
22.08.2001 US 934081

(71) Applicant: Nikon Corporation
Tokyo 100-8331 (JP)

(72) Inventor:
  • INOUE, Fuyuhiko
    San Mateo, CA 94402 (US)

(74) Representative: Viering, Jentschura & Partner 
Steinsdorfstrasse 6
80538 München
80538 München (DE)

   


(54) INTERFEROMETER SYSTEM