(19)
(11) EP 1 446 679 A2

(12)

(88) Date of publication A3:
18.03.2004

(43) Date of publication:
18.08.2004 Bulletin 2004/34

(21) Application number: 02801990.9

(22) Date of filing: 24.10.2002
(51) International Patent Classification (IPC)7G01S 1/00
(86) International application number:
PCT/IL2002/000854
(87) International publication number:
WO 2003/036321 (01.05.2003 Gazette 2003/18)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SK TR
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 24.10.2001 US 983430

(71) Applicant: Nexense Ltd.
Yavne 81 220 (IL)

(72) Inventor:
  • ARIAV, Arie
    79 304 Doar Na Hof Ashkelon (IL)

(74) Representative: Schmitz, Jean-Marie 
Dennemeyer & Associates SàrlP.O. Box 1502
1015 Luxembourg
1015 Luxembourg (LU)

   


(54) HIGH-PRECISION MEASURING METHOD AND APPARATUS