(19)
(11)
EP 1 446 679 A2
(12)
(88)
Date of publication A3:
18.03.2004
(43)
Date of publication:
18.08.2004
Bulletin 2004/34
(21)
Application number:
02801990.9
(22)
Date of filing:
24.10.2002
(51)
International Patent Classification (IPC)
7
:
G01S
1/00
(86)
International application number:
PCT/IL2002/000854
(87)
International publication number:
WO 2003/036321
(
01.05.2003
Gazette 2003/18)
(84)
Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SK TR
Designated Extension States:
AL LT LV MK RO SI
(30)
Priority:
24.10.2001
US 983430
(71)
Applicant:
Nexense Ltd.
Yavne 81 220 (IL)
(72)
Inventor:
ARIAV, Arie
79 304 Doar Na Hof Ashkelon (IL)
(74)
Representative:
Schmitz, Jean-Marie
Dennemeyer & Associates SÃ rlP.O. Box 1502
1015 Luxembourg
1015 Luxembourg (LU)
(54)
HIGH-PRECISION MEASURING METHOD AND APPARATUS