System for analyzing mass spectrometric data

(19)

(11)

EP 1 447 833 A3

(12)	EUROPEAN PATENT APPLICATION

(88)	Date of publication A3:
	09.08.2006 Bulletin 2006/32

(43)	Date of publication A2:
	18.08.2004 Bulletin 2004/34

(21)	Application number: 03025752.1

(22)	Date of filing: 10.11.2003

(51)

International Patent Classification (IPC):

H01J 49/26^(2006.01)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR
	Designated Extension States:
	AL LT LV MK

(30)

Priority:

14.02.2003 JP 2003035928

(71)	Applicants:
	Hitachi, Ltd. Chiyoda-ku, Tokyo 100-8010 (JP) Hitachi High-Technologies Corporation Tokyo (JP)

(72)	Inventors:
	Yoshinari, Kiyomi, Hitachi Ltd. Intel.Prop.Grp. Chiyoda-ku Tokyo 100-8220 (JP) Kobayashi, Kinya, Hitachi Ltd. Intel.Prop.Grp. Chiyoda-ku Tokyo 100-8220 (JP) Otake, Atsushi, Hitachi Ltd. Intel.Prop.Grp. Chiyoda-ku Tokyo 100-8220 (JP) Okumoto, Toyoharu, Hitachi Ltd. Intel.Prop.Grp. Chiyoda-ku Tokyo 100-8220 (JP)

(74)	Representative: Strehl Schübel-Hopf & Partner
	Maximilianstrasse 54 80538 München 80538 München (DE)

(54)	System for analyzing mass spectrometric data

(57) A system for analyzing mass spectrometric data is provided, which has an data input means for entering mass spectrometric data of a parent ion and dissociated ions resulting from multiple dissociation of the parent ion, and an analytical means for providing characteristics of a candidate for estimated structure of a precursor ion that is representative of pre-dissociation structure at each stage of dissociation. The system analyzes one of the structure of precursor ion at each stage of dissociation and the structure of parent ion based on the characteristics and spectrometric data.

Search report