(19)
(11) EP 1 463 205 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
26.05.2010 Bulletin 2010/21

(45) Mention of the grant of the patent:
18.11.2009 Bulletin 2009/47

(21) Application number: 03447069.0

(22) Date of filing: 28.03.2003
(51) International Patent Classification (IPC): 
H03M 3/02(2006.01)
G01D 5/12(2006.01)
 G01D 3/02(2006.01)

(54)

Method and system for the indirect measurement of a physical value

Verfahren und Vorrichtung zur indirekten Messung einer physikalischen Grösse

Méthode et appareil pour la mesure indirecte d'une grandeur physique

(84) Designated Contracting States:
DE FR

(43) Date of publication of application:
29.09.2004 Bulletin 2004/40

(73) Proprietor: Semiconductor Components Industries, LLC
Phoenix, AZ 85008 (US)

(72) Inventors:
  • Horsky,Pavel
    63800 Brno (CZ)
  • Koudar,Ivan
    66451 Slapanice u Brna (CZ)

(74) Representative: Bird, William Edward et al
Bird Goën & Co. Klein Dalenstraat 42A
3020 Winksele
3020 Winksele (BE)


(56) References cited: : 
EP-A- 1 102 405
 US-A- 6 140 952
   
       
    Note: Within nine months from the publication of the mention of the grant of the European patent, any person may give notice to the European Patent Office of opposition to the European patent granted. Notice of opposition shall be filed in a written reasoned statement. It shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).