(19)
(11) EP 1 475 457 A8

(12) CORRECTED EUROPEAN PATENT APPLICATION

(48) Corrigendum issued on:
23.02.2005 Bulletin 2005/08

(43) Date of publication:
10.11.2004 Bulletin 2004/46

(21) Application number: 04017496.3

(22) Date of filing: 28.10.2002
(51) International Patent Classification (IPC)7C23C 14/00, C23C 14/02, C23C 14/06, C23C 14/16, C23C 28/02, H01L 21/768
(84) Designated Contracting States:
DE FR GB

(30) Priority: 14.11.2001 JP 2001348325
05.02.2002 JP 2002027738
21.02.2002 JP 2002044289
21.02.2002 JP 2002044296

(62) Application number of the earlier application in accordance with Art. 76 EPC:
02024416.6 / 1312696

(71) Applicant: Mitsubishi Heavy Industries, Ltd.
Tokyo (JP)

(72) Inventors:
  • Sakamoto, Hitoshi, c/o Mitsubishi Heavy Ind., Ltd.
    Kanagawa (JP)
  • Yahata, Naoki, c/o Mitsubishi Heavy Ind., Ltd.
    Hyogo (JP)
  • Matsuda, Ryuichi, c/o Mitsubishi Heavy Ind., Ltd.
    Hyogo (JP)
  • Ooba, Yoshiyuki, c/o Mitsubishi Heavy Ind., Ltd.
    Kanagawa (JP)
  • Nishimori, Toshihiko, Mitsubishi Heavy Ind., Ltd.
    Hyogo (JP)

(74) Representative: HOFFMANN - EITLE 
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München
81925 München (DE)

 
Remarks:
This application was filed on 23 - 07 - 2004 as a divisional application to the application mentioned under INID code 62.
 


(54) Metal barrier film production apparatus, metal barrier film production method, metal film production method, and metal film production apparatus


(57) A barrier metal film production method comprising: supplying a source gas containing a halogen to an interior of a chamber between a substrate and a metallic etched member; converting an atmosphere within the chamber into a plasma to generate a source gas plasma so that the etched member is etched with the source gas plasma to form a precursor from a metal component contained in the etched member and the source gas; exciting a nitrogen-containing gas in a manner isolated from the chamber accommodating the substrate; forming a metal nitride upon reaction between excited nitrogen and the precursor; and making a temperature of the substrate lower than a temperature of means for formation of the metal nitride to form the metal nitride as a film on the substrate.