(19)
(11)
EP 1 537 378 A1
(12)
(43)
Date of publication:
08.06.2005
Bulletin 2005/23
(21)
Application number:
03795001.1
(22)
Date of filing:
09.09.2003
(51)
International Patent Classification (IPC)
7
:
G01B
9/04
,
G06T
7/60
(86)
International application number:
PCT/EP2003/010013
(87)
International publication number:
WO 2004/025217
(
25.03.2004
Gazette 2004/13)
(84)
Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR
(30)
Priority:
13.09.2002
DE 10242628
(71)
Applicant:
Leica Microsystems (Schweiz) AG
9435 Heerbrugg (CH)
(72)
Inventor:
NEY, Christophe
CH-9435 Heerbrug (CH)
(74)
Representative:
Grunert, Marcus, Dipl.-Phys.
Hössle Kudlek & PartnerPatentanwältePostfach 10 23 38
70019 Stuttgart
70019 Stuttgart (DE)
(54)
METHOD AND SYSTEM FOR SIZE CALIBRATION