(19)
(11) EP 1 537 378 A1

(12)

(43) Date of publication:
08.06.2005 Bulletin 2005/23

(21) Application number: 03795001.1

(22) Date of filing: 09.09.2003
(51) International Patent Classification (IPC)7G01B 9/04, G06T 7/60
(86) International application number:
PCT/EP2003/010013
(87) International publication number:
WO 2004/025217 (25.03.2004 Gazette 2004/13)
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

(30) Priority: 13.09.2002 DE 10242628

(71) Applicant: Leica Microsystems (Schweiz) AG
9435 Heerbrugg (CH)

(72) Inventor:
  • NEY, Christophe
    CH-9435 Heerbrug (CH)

(74) Representative: Grunert, Marcus, Dipl.-Phys. 
Hössle Kudlek & PartnerPatentanwältePostfach 10 23 38
70019 Stuttgart
70019 Stuttgart (DE)

   


(54) METHOD AND SYSTEM FOR SIZE CALIBRATION