MASS SPECTROMETRY WITH SEGMENTED RF MULTIPLE ION GUIDES IN VARIOUS PRESSURE REGIONS - Patent 1549914

(19)

(11)

EP 1 549 914 A1

(12)

(43)	Date of publication:
	06.07.2005 Bulletin 2005/27

(21)	Application number: 03756377.2

(22)	Date of filing: 30.05.2003

(51)	International Patent Classification (IPC)⁷: G01D 5/44, H01J 49/00, H01J 49/40

(86)	International application number:
	PCT/US2003/017437

(87)	International publication number:
	WO 2003/102508 (11.12.2003 Gazette 2003/50)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR
	Designated Extension States:
	AL LT LV MK

(30)

Priority:

31.05.2002 US 385100 P

(71)	Applicant: ANALYTICA OF BRANFORD, INC.
	Branford, CT 06405 (US)

(72)	Inventors:
	WHITEHOUSE, Craig, M. DriveBranford, CT 06405 (US) WELKIE, David, G.c/o Analytica of Branford, Inc. Branford, CT 06405 (US) JAVAHERY, GholamrezaAnalytica of Branford, Inc. Branford, CT 06405 (US) COUSINS, Lisac/o Analytica of Branford, Inc. Branford, CT 06405 (US)

(74)	Representative: Richardson, Mark Jonathan et al
	Marks & Clerk90 Long Acre London WC2E 9RA London WC2E 9RA (GB)

(54)	MASS SPECTROMETRY WITH SEGMENTED RF MULTIPLE ION GUIDES IN VARIOUS PRESSURE REGIONS