HIGH DENSITY WRITE-ONCE RECORDING MEDIUM ALLOWING DEFECT MANAGEMENT, AND METHOD AND APPARATUS FOR MANAGING DEFECTS - Patent 1550123

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EP 1 550 123 A1

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(43)	Date of publication:
	06.07.2005 Bulletin 2005/27

(21)	Application number: 03730893.9

(22)	Date of filing: 05.06.2003

(51)	International Patent Classification (IPC)⁷: G11B 20/18

(86)	International application number:
	PCT/KR2003/001113

(87)	International publication number:
	WO 2004/015707 (19.02.2004 Gazette 2004/08)

(84)	Designated Contracting States:
	AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR
	Designated Extension States:
	AL LT LV MK

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Priority:

12.08.2002 KR 2002047515

(71)	Applicant: Samsung Electronics Co., Ltd.
	Suwon-si,Gyeonggi-do 442-742 (KR)

(72)	Inventors:
	KO, Jung-Wan315-401 Daewoo Apt., 956-2 Suwon-siGyeonggi-do 442-470 (KR) LEE, Kyung-Geun122-1002 Sibeom Hanshin Apt., 87 Gyeonggi-do 463-050 (KR)

(74)	Representative: Brandon, Paul Laurence et al
	APPLEYARD LEES,15 Clare Road Halifax HX1 2HY Halifax HX1 2HY (GB)

(54)	HIGH DENSITY WRITE-ONCE RECORDING MEDIUM ALLOWING DEFECT MANAGEMENT, AND METHOD AND APPARATUS FOR MANAGING DEFECTS